Effect of lattice excitations on transient near-edge x-ray absorption spectroscopy

Rothenbach, N.; Gruner, M. E.; Ollefs, K.; Schmitz-Antoniak, C.; Salamon, S.; Zhou, P.; Li, R.; Mo, M.; Park, S.; Shen, X.; Weathersby, S.; Yang, J.; Wang, X. J.; Sipr, O.; Ebert, H.; Sokolowski-Tinten, K.; Pentcheva, R.; Bovensiepen, U.; Eschenlohr, A. und Wende, H. (2021): Effect of lattice excitations on transient near-edge x-ray absorption spectroscopy. In: Physical Review B, Bd. 104, Nr. 14, 144302

Abstract

Time-dependent and constituent-specific spectral changes in soft near-edge x-ray absorption spectroscopy (XAS) of an [Fe/MgO](8) metal/insulator heterostructure after laser excitation are analyzed at the O K-edge with picosecond time resolution. The oxygen absorption edge of the insulator features a uniform intensity decrease of the fine structure at elevated phononic temperatures, which can be quantified by a simple simulation and fitting procedure presented here. Combining XAS with ultrafast electron diffraction measurements and ab initio calculations demonstrates that the transient intensity changes in XAS can be assigned to a transient lattice temperature. Thus, the sensitivity of transient near-edge XAS to phonons is demonstrated.

• Dokumententyp: Zeitschriftenartikel
• Fakultät: Chemie und Pharmazie > Department Chemie
• Themengebiete: 500 Naturwissenschaften und Mathematik > 540 Chemie
• ISSN: 2469-9950
• Sprache: Englisch