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Neuhaus, Marcel; Schötz, Johannes; Aulich, Mario; Srivastava, Anchit; Kimbaras, Dziugas; Smejkal, Valerie; Pervak, Vladimir; Alharbi, Meshaal; Azzeer, Abdallah M.; Libisch, Florian; Lemell, Christoph; Burgdörfer, Joachim; Wang, Zilong and Kling, Matthias F. ORCID logoORCID: https://orcid.org/0000-0002-1710-0775 (2022): Transient field-resolved reflectometry at 50-100 THz. In: Optica, Vol. 9, No. 1: pp. 42-49 [PDF, 3MB]

Abstract

Transient field-resolved spectroscopy enables studies of ultrafast dynamics in molecules, nanostructures, or solids with sub-cycle resolution, but previous work has so far concentrated on extracting the dielectric response at frequencies below 50 THz. Here, we implemented transient field-resolved reflectometry at 50-100 THz(3-6 mu m) with MHz repetition rate employing 800 nm few-cycle excitation pulses that provide sub-10 fs temporal resolution. The capabilities of the technique are demonstrated in studies of ultrafast photorefractive changes in semiconductors Ge and GaAs, where the high frequency range permits to explore the resonance-free Drude response. The extended frequency range in transient field-resolved spectroscopy can further enable studies with so far inaccessible transitions, including intramolecular vibrations in a large range of systems. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.

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