Logo Logo
Hilfe
Hilfe
Switch Language to English

Cattaneo, Mauricio; Müller-Caspary, Knut ORCID logoORCID: https://orcid.org/0000-0002-2588-7993; Barthel, Juri ORCID logoORCID: https://orcid.org/0000-0003-3914-4346; MacArthur, Katherine E.; Gauquelin, Nicolas; Lipinska-Chwalek, Marta; Verbeeck, Johan; Allen, Leslie J. und Dunin-Borkowski, Rafal E. (2024): Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy. In: Ultramicroscopy, Bd. 267, 114050 [PDF, 3MB]

Abstract

Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM (STEM) data to determine the local mistilt from a major zone axis. It is based on a geometric analysis of Kikuchi bands within a single diffraction pattern, yielding the center of the Laue circle. Whereas the approach is not limited to convergent illumination, it is here developed using unit-cell averaged diffraction patterns corresponding to high-resolution STEM settings. In simulation studies, an accuracy of approximately 0.1 mrad is found. The method is implemented in automated software and applied to crystallographic tilt and in-plane rotation mapping in two experimental cases. In particular, orientation maps of high-Mn steel and an epitaxially grown La Sr MnO -SrTiO interface are presented. The results confirm the estimates of the simulation study and indicate that tilt mapping can be performed consistently over a wide field of view with diameters well above 100 nm at unit cell real space sampling.

Dokument bearbeiten Dokument bearbeiten