Tip-enhanced Raman spectroscopic imaging of localized defects in carbon nanotubes

Georgi, Carsten und Hartschuh, Achim (2010): Tip-enhanced Raman spectroscopic imaging of localized defects in carbon nanotubes. In: Applied physics letters, Vol. 97, No. 14, 143117

Abstract

We used tip-enhanced Raman spectroscopy to study defect induced D-band Raman scattering in metallic single-walled carbon nanotubes with a spatial resolution of 15 nm. The spatial extent of the D-band signal in the vicinity of localized defects is visualized and found to be about 2 nm only. Using the strong optical fields underneath the tip, we photogenerate localized defects and derive a relation between defect density and resulting D-band intensity.

• Item Type: Journal article
• Form of publication: Publisher's Version
• Faculties: Chemistry and Pharmacy
• Subjects: 500 Science > 540 Chemistry
• ISSN: 0003-6951
• Language: English