Probing Exciton Localization in Single-Walled Carbon Nanotubes Using High-Resolution Near-Field Microscopy

Georgi, Carsten; Green, Alexander A.; Hersam, Mark C. und Hartschuh, Achim (2010): Probing Exciton Localization in Single-Walled Carbon Nanotubes Using High-Resolution Near-Field Microscopy. In: ACS Nano, Vol. 4, No. 10: pp. 5914-5920

Abstract

We observe localization of excitons in semiconducting single-walled carbon nanotubes at room temperature using high-resolution near-field photoluminescence (PL) microscopy. Localization is the result of spatially confined exciton energy minima with depths of more than 15 meV connected to lateral energy gradients exceeding 2 meV/nm as evidenced by energy-resolved PL imaging. Simulations of exciton diffusion in the presence of energy variations support this interpretation predicting strongly enhanced PL at local energy minima.

• Item Type: Journal article
• Form of publication: Publisher's Version
• Keywords: single-walled carbon nanotubes; photoluminescence; excitons; localization; near-field microscopy
• Faculties: Chemistry and Pharmacy
• Subjects: 500 Science > 540 Chemistry
• ISSN: 1936-0851
• Language: English