High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes

Hartschuh, Achim; Sánchez, Erik J.; Xie, X. Sunney und Novotny, Lukas (2003): High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes. In: Physical Review Letters, Vol. 90, No. 9: 095503-1-095503-4

Abstract

We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of ≈25  nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.

• Item Type: Journal article
• Form of publication: Publisher's Version
• Faculties: Chemistry and Pharmacy
• Subjects: 500 Science > 540 Chemistry
• ISSN: 0031-9007
• Language: English