Hartschuh, Achim; Sánchez, Erik J.; Xie, X. Sunney; Novotny, Lukas
High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes.
In: Physical Review Letters, Vol. 90, No. 9: 095503-1-095503-4
We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of ≈25 nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.