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Hartschuh, Achim; Sánchez, Erik J.; Xie, X. Sunney; Novotny, Lukas (2003): High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes. In: Physical Review Letters, Vol. 90, No. 9: 095503-1-095503-4




We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of ≈25  nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.