ORCID: https://orcid.org/0000-0002-6525-9449 and Baum, P.
(2016):
All-optical control and metrology of electron pulses.
In: Science, Vol. 352, No. 6284: pp. 429-433
Abstract
Short electron pulses are central to time-resolved atomic-scale diffraction and electron microscopy, streak cameras, and free-electron lasers. We demonstrate phase-space control and characterization of 5-picometer electron pulses using few-cycle terahertz radiation, extending concepts of microwave electron pulse compression and streaking to terahertz frequencies. Optical-field control of electron pulses provides synchronism to laser pulses and offers a temporal resolution that is ultimately limited by the rise-time of the optical fields applied. We used few-cycle waveforms carried at 0.3 terahertz to compress electron pulses by a factor of 12 with a timing stability of <4 femtoseconds (root mean square) and measure them by means of field-induced beam deflection (streaking). Scaling the concept toward multiterahertz control fields holds promise for approaching the electronic time scale in time-resolved electron diffraction and microscopy.
Item Type: | Journal article |
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Faculties: | Physics |
Subjects: | 500 Science > 530 Physics |
ISSN: | 0036-8075 |
Language: | English |
Item ID: | 47474 |
Date Deposited: | 27. Apr 2018, 08:13 |
Last Modified: | 08. May 2024, 09:23 |