Abstract
We report a time-of-flight spectrometer for electron pulses at up to 30 keV, which is a suitable energy for atomic-resolution femtosecond investigations via time-resolved electron diffraction, microscopy, and energy loss spectroscopy. For realistic femtosecond beams without apertures, the instrument's energy resolution is similar to 0.5 eV (full width at half maximum) or 2 x 10(-5) at a throughput of 50%-90%. We demonstrate the analyzer's versatility by three first applications, namely, femtosecond electron pulse metrology via optical streaking, in situ drift correction in laser-microwave synchronization for electron pulse compression, and time-resolved electron energy loss spectroscopy of aluminum, showing the instrument's capability of tracking plasmonic loss peak positions with few-meV accuracy. (C) 2016 AIP Publishing LLC.
Dokumententyp: | Zeitschriftenartikel |
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Fakultät: | Physik |
Themengebiete: | 500 Naturwissenschaften und Mathematik > 530 Physik |
ISSN: | 0034-6748 |
Sprache: | Englisch |
Dokumenten ID: | 47497 |
Datum der Veröffentlichung auf Open Access LMU: | 27. Apr. 2018, 08:13 |
Letzte Änderungen: | 08. Mai 2024, 09:24 |