Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

Chew, S. H.; Gliserin, A.; Schmidt, J.; Bian, H.; Nobis, S.; Schertz, F.; Kübel, M.; Yang, Y.-Y.; Loitsch, B.; Stettner, T.; Finley, J. J.; Späth, C.; Ouacha, H.; Azzeer, A. M. und Kleineberg, U. (2016): Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy. In: Applied Physics B: Lasers and Optics, Bd. 122, Nr. 4, 102

Abstract

A time of flight-photoemission electron microscope is combined with a single-shot stereographic above-threshold ionization phase meter for studying attosecond control of electrons in tailored plasmonic nanostructures spatially and energetically via a carrier-envelope phase tagging technique. First carrier-envelope phase-resolved measurements of gold nanoparticles on gold plane and surface roughness from a gold film show an apparent carrierenvelope phase modulation with a period of p. This modulation is found to originate from an intensity dependence of the photoelectron spectra and the carrier-envelope phase measurement rather than from an intrinsic carrier-envelope phase dependence, which is confirmed by simulations. This useful finding suggests that intensity tagging should be considered for phase tagging experiments on plasmonic nanostructures with low carrier-envelope phase sensitivity in order to correct for the intensity-related carrier-envelope phase artifact.

• Dokumententyp: Zeitschriftenartikel
• Fakultät: Physik
• Themengebiete: 500 Naturwissenschaften und Mathematik > 530 Physik
• ISSN: 1432-0649
• Sprache: Englisch