Carrier-Envelope-Phase-and Angle-resolved Photoelectron Streaking Measurements on W(110)

Schmidt, Jürgen; Guggenmos, Alexander; Chew, Soo Hoon; Gliserin, Alexander und Kleineberg, Ulf (2016): Carrier-Envelope-Phase-and Angle-resolved Photoelectron Streaking Measurements on W(110). Conference on Lasers and Electro-Optics, San Jose, Calif., USA, 5-10 June 2016. In: 2016 Conference on Lasers and Electro-Optics (CLEO) : 5-10 June 2016, Piscataway, NJ: IEEE Computer Society.

Abstract

We present an extended streaking measurement scheme by additionally detecting the electron emission angle and the carrier-envelope phase of the IR laser field. This allows a more complete and detailed insight into the electron dynamics in solids and gives access to ultrafast band structure dynamics.

• Dokumententyp: Konferenzbeitrag (Bericht)
• Fakultät: Physik
• Themengebiete: 500 Naturwissenschaften und Mathematik > 530 Physik
• ISSN: 2160-9020
• Ort: Piscataway, NJ
• Sprache: Englisch