A versatile platform for magnetostriction measurements in thin films

Pernpeintner, M.; Holländer, R. B.; Seitner, M. J.; Weig, E. M.; Gross, R.; Goennenwein, S. T. B. und Huebl, H. (2016): A versatile platform for magnetostriction measurements in thin films. In: Journal of Applied Physics, Vol. 119, No. 9, 93901

Abstract

We present a versatile nanomechanical sensing platform for the investigation of magnetostriction in thin films. It is based on a doubly clamped silicon nitride nanobeam resonator covered with a thin magnetostrictive film. Changing the magnetization direction within the film plane by an applied magnetic field generates a magnetoelastic stress and thus changes the resonance frequency of the nanobeam. A measurement of the resulting resonance frequency shift, e.g., by optical interferometry, allows to quantitatively determine the magnetostriction constants of the thin film. In a proof-of-principle experiment, we determine the magnetostriction constants of a 10 nm thick polycrystalline cobalt film, showing very good agreement with literature values. The presented technique aims, in particular, for the precise measurement of magnetostriction in a variety of (conducting and insulating) thin films, which can be deposited by, e.g., electron beam deposition, thermal evaporation, or sputtering. (C) 2016 AIP Publishing LLC.

• Item Type: Journal article
• Faculties: Physics
• Research Centers: Nanosystems Initiative Munich (NIM)
• Subjects: 500 Science > 530 Physics
• ISSN: 0021-8979
• Language: English