Logo Logo
Help
Contact
Switch Language to German
Sibidanov, A.; Varvell, K. E.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Aushev, T.; Ayad, R.; Babu, V.; Badhrees, I.; Bahinipati, S.; Bakich, A. M.; Bansal, V.; Barberio, E.; Behera, P.; Bhuyan, B.; Biswal, J.; Bozek, A.; Bracko, M.; Browder, T. E.; Cervenkov, D.; Chang, P.; Chekelian, V.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, K.; Choi, S.-K.; Choi, Y.; Cinabro, D.; Czank, T.; Dash, N.; Carlo, S. di; Dolezal, Z.; Drasal, Z.; Dutta, D.; Eidelman, S.; Epifanov, D.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Goldenzweig, P.; Greenwald, D.; Guan, Y.; Guido, E.; Haba, J.; Hayasaka, K.; Hayashii, H.; Hedges, M. T.; Hirose, S.; Hou, W.-S.; Hsu, C.-L.; Iijima, T.; Inami, K.; Inguglia, G.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jägle, I.; Jeon, H. B.; Jin, Y.; Joo, K. K.; Julius, T.; Kahn, J.; Kaliyar, A. B.; Kang, K. H.; Karyan, G.; Kawasaki, T.; Kiesling, C.; Kim, D. Y.; Kim, J. B.; Kim, S. H.; Kim, Y. J.; Kinoshita, K.; Kodys, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Krokovny, P.; Kuhr, T.; Kulasiri, R.; Kumar, R.; Kuzmin, A.; Kwon, Y.-J.; Lange, J. S.; Lee, I. S.; Li, C. H.; Li, L.; Gioi, L. Li; Libby, J.; Liventsev, D.; Lubej, M.; Luo, T.; Masuda, M.; Matsuda, T.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Moon, H. K.; Mori, T.; Mussa, R.; Nakano, E.; Nakao, M.; Nanut, T.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Niiyama, M.; Nisar, N. K.; Nishida, S.; Ogawa, S.; Okuno, S.; Ono, H.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Park, C.-S.; Park, C. W.; Park, H.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Ritter, M.; Rostomyan, A.; Rozanska, M.; Sakai, Y.; Salehi, M.; Sandilya, S.; Sato, Y.; Savinov, V.; Schneider, O.; Schnell, G.; Schwanda, C.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shebalin, V.; Shen, C. P.; Shibata, T.-A.; Shiu, J.-G.; Simon, F.; Sokolov, A.; Solovieva, E.; Staric, M.; Strube, J. F.; Stypula, J.; Sumihama, M.; Sumisawa, K.; Sumiyoshi, T.; Takizawa, M.; Tamponi, U.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uehara, S.; Uglov, T.; Unno, Y.; Uno, S.; Urquijo, P.; Hulse, C. van; Varner, G.; Vorobyev, V.; Wang, C. H.; Wang, M.-Z.; Wang, P.; Watanabe, M.; Watanuki, S.; Widmann, E.; Won, E.; Yamashita, Y.; Ye, H.; Yelton, J.; Yuan, C. Z.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhukova, V.; Zhulanov, V.; Zupanc, A. (2018): Search for B- -> mu(-)(nu)over-bar(mu) Decays at the Belle Experiment. In: Physical Review Letters, Vol. 121, No. 3, 31801
[img]
Preview
Creative Commons Attribution 268kB

Abstract

We report the results of a search for the rare, purely leptonic decay B- -> mu(-)(nu) over bar (mu) performed with a 711 fb(-1) data sample that contains 772 x 10(6) B (B) over bar pairs, collected near the Upsilon(4S) resonance with the Belle detector at the KEKB asymmetric-energy e(+)e(-) collider. The signal events are selected based on the presence of a high momentum muon and the topology of the rest of the event showing properties of a generic B-meson decay, as well as the missing energy and momentum being consistent with the hypothesis of a neutrino from the signal decay. We find a 2.4 standard deviation excess above background including systematic uncertainties, which corresponds to a branching fraction of B(B- -> mu(-)(nu) over bar (mu)) = (6.46 +/- 2.22 +/- 1.60) x 10(-7) or a frequentist 90% confidence level interval on the B- -> mu(-)(nu) over bar (mu) branching fraction of [2.9, 10.7] x 10(-7).

Search for authors
Export