All-electronic terahertz nanoscopy

Liewald, Clemens; Mastel, Stefan; Hesler, Jeffrey; Huber, Andreas J.; Hillenbrand, Rainer und Keilmann, Fritz (2018): All-electronic terahertz nanoscopy. In: Optica, Bd. 5, Nr. 2: S. 159-163

Abstract

Probing conductivity in a contactless way with nanoscale resolution is a pressing demand in such active fields as quantum materials, superconductivity, and molecular electronics. Here, we demonstrate a laser-and cryogen-free microwave-technology-based scattering-type scanning near-field optical microscope powered by an easily aligned free-space beam with a tunable frequency up to 0.75 THz. It uses Schottky diode components to record background-free amplitude and phase nano-images, for the first time in the terahertz range, which is uniquely sensitive for assessing conduction phenomena. Images of Si with doped nanostructures prove a conductance sensitivity corresponding to 10(16) cm(-3) mobile carriers, at 50 nm spatial resolution.

• Dokumententyp: Zeitschriftenartikel
• Fakultät: Physik
• Fakultätsübergreifende Einrichtungen: Center for NanoScience (CENS)
• Themengebiete: 500 Naturwissenschaften und Mathematik > 500 Naturwissenschaften ; 500 Naturwissenschaften und Mathematik > 530 Physik
• ISSN: 2334-2536
• Sprache: Englisch