
Abstract
Probing conductivity in a contactless way with nanoscale resolution is a pressing demand in such active fields as quantum materials, superconductivity, and molecular electronics. Here, we demonstrate a laser-and cryogen-free microwave-technology-based scattering-type scanning near-field optical microscope powered by an easily aligned free-space beam with a tunable frequency up to 0.75 THz. It uses Schottky diode components to record background-free amplitude and phase nano-images, for the first time in the terahertz range, which is uniquely sensitive for assessing conduction phenomena. Images of Si with doped nanostructures prove a conductance sensitivity corresponding to 10(16) cm(-3) mobile carriers, at 50 nm spatial resolution.
Item Type: | Journal article |
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Faculties: | Physics |
Research Centers: | Center for NanoScience (CENS) |
Subjects: | 500 Science > 500 Science 500 Science > 530 Physics |
URN: | urn:nbn:de:bvb:19-epub-67989-8 |
ISSN: | 2334-2536 |
Language: | English |
Item ID: | 67989 |
Date Deposited: | 19. Jul 2019, 12:23 |
Last Modified: | 04. Nov 2020, 13:50 |