Abstract
We investigated the relationship between crystallinity, deep trap states and PEC performance of g-C3N4 photoelectrodes. Long-lived charge carriers were present in the more poorly crystalline samples, due to deeper trap states, which inversely correlated with photoelectrochemical performance. The charge diffusion length in a compact g-C3N4 film was determined to be ca. 1000 nm.
| Dokumententyp: | Zeitschriftenartikel |
|---|---|
| Fakultät: | Physik |
| Themengebiete: | 500 Naturwissenschaften und Mathematik > 530 Physik |
| ISSN: | 1359-7345 |
| Sprache: | Englisch |
| Dokumenten ID: | 82783 |
| Datum der Veröffentlichung auf Open Access LMU: | 15. Dez. 2021 15:03 |
| Letzte Änderungen: | 15. Dez. 2021 15:03 |
