Abstract
We investigated the relationship between crystallinity, deep trap states and PEC performance of g-C3N4 photoelectrodes. Long-lived charge carriers were present in the more poorly crystalline samples, due to deeper trap states, which inversely correlated with photoelectrochemical performance. The charge diffusion length in a compact g-C3N4 film was determined to be ca. 1000 nm.
Dokumententyp: | Zeitschriftenartikel |
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Fakultät: | Physik |
Themengebiete: | 500 Naturwissenschaften und Mathematik > 530 Physik |
ISSN: | 1359-7345 |
Sprache: | Englisch |
Dokumenten ID: | 82783 |
Datum der Veröffentlichung auf Open Access LMU: | 15. Dez. 2021, 15:03 |
Letzte Änderungen: | 15. Dez. 2021, 15:03 |