Abstract
We investigated the relationship between crystallinity, deep trap states and PEC performance of g-C3N4 photoelectrodes. Long-lived charge carriers were present in the more poorly crystalline samples, due to deeper trap states, which inversely correlated with photoelectrochemical performance. The charge diffusion length in a compact g-C3N4 film was determined to be ca. 1000 nm.
| Item Type: | Journal article |
|---|---|
| Faculties: | Physics |
| Subjects: | 500 Science > 530 Physics |
| ISSN: | 1359-7345 |
| Language: | English |
| Item ID: | 82783 |
| Date Deposited: | 15. Dec 2021 15:03 |
| Last Modified: | 15. Dec 2021 15:03 |
