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Seidl, R.; Adachi, I; Ahn, J. K.; Aihara, H.; Asner, D. M.; Aulchenko, V; Aushev, T.; Ayad, R.; Bakich, A. M.; Bansal, V; Behera, P.; Beleno, C.; Berger, M.; Bhardwaj, V; Bilka, T.; Biswal, J.; Bobrov, A.; Bozek, A.; Bracko, M.; Cao, L.; Cervenkov, D.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, H. E.; Cho, K.; Choi, Y.; Choudhury, S.; Cinabro, D.; Cunliffe, S.; Di Carlo, S.; Dolezal, Z.; Dong, T.; Drasal, Z.; Eidelman, S.; Epifanov, D.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Garg, R.; Gaur, V; Gabyshev, N.; Garmash, A.; Gelb, M.; Giri, A.; Goldenzweig, P.; Golob, B.; Grzymkowska, O.; Hayasaka, K.; Hayashii, H.; Hou, W-S; Iijima, T.; Inami, K.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Julius, T.; Kaliyar, A. B.; Kawasaki, T.; Kichimi, H.; Kiesling, C.; Kim, C. H.; Kim, D. Y.; Kim, H. J.; Kim, J. B.; Kim, S. H.; Kodys, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Kröger, R.; Krokovny, P.; Kuhr, T.; Kulasiri, R.; Kuzmin, A.; Kwon, Y-J; Lalwani, K.; Lange, J. S.; Lee, I. S.; Lee, J. K.; Lee, J. Y.; Lee, S. C.; Levit, D.; Li, C. H.; Li, L. K.; Li, Y. B.; Li Gioi, L.; Libby, J.; Liventsev, D.; Lubej, M.; Luo, T.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Matvienko, D.; Merola, M.; Miyabayashi, K.; Mizuk, R.; Mohanty, S.; Mori, T.; Mussa, R.; Nakano, E.; Nakano, T.; Nakao, M.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Nishida, S.; Nishimura, K.; Ogawa, S.; Ono, H.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Park, S-H; Patra, S.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Popov, V; Prencipe, E.; Purohit, M.; Rostomyan, A.; Russo, G.; Sakai, Y.; Salehi, M.; Sandilya, S.; Santelj, L.; Sanuki, T.; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shebalin, V; Shen, C. P.; Shibata, T-A; Shiu, J-G; Shwartz, B.; Sokolov, A.; Solovieva, E.; Staric, M.; Stottler, Z. S.; Sumihama, M.; Sumiyoshi, T.; Sutcliffe, W.; Takizawa, M.; Tamponi, U.; Tanida, K.; Tao, Y.; Tenchini, F.; Uchida, M.; Uehara, S.; Uglov, T.; Unno, Y.; Uno, S.; Urquijo, P.; Usov, Y.; Van Tonder, R.; Varner, G.; Vossen, A.; Waheed, E.; Wang, B.; Wang, C. H.; Wang, M-Z; Wang, P.; Wang, X. L.; Watanabe, M.; Won, E.; Yang, S. B.; Ye, H.; Yelton, J.; Yin, J. H.; Yuan, C. Z.; Zhang, Z. P.; Zhilich, V and Zhukova, V (2019): Transverse momentum dependent production cross sections of charged pions, kaons and protons produced in inclusive e(+)e(-) annihilation at root s=10.58 GeV. In: Physical Review D, Vol. 99, No. 11, 112006

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We report measurements of the production cross sections of charged pions, kaons, and protons as a function of fractional energy, the event-shape variable called thrust, and the transverse momentum with respect to the thrust axis. These measurements access the transverse momenta created in the fragmentation process, which are of critical importance to the understanding of any transverse-momentum-dependent distribution and fragmentation functions. The low transverse-momentum part of the cross sections can be well described by Gaussians in transverse momentum as is generally assumed but the fractional-energy dependence is nontrivial and different hadron types have varying Gaussian widths. The width of these Gaussians decreases with thrust and shows an initially rising, then decreasing fractional-energy dependence. The widths for pions and kaons are comparable within uncertainties, while those for protons are significantly narrower. These single-hadron cross sections and Gaussian widths arc obtained from a 558 fb(-1) data sample collected at the Upsilon(4S) resonance with the Belle detector at the KEKB asymmetric-energy e(+)e(-) collider.

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