Abstract
We describe a simple method for measuring the residual fast phase noise of a cavity-stabilized laser using the cavity as a reference. The method is based on generating a beat note between the laser output and the strongly filtered light transmitted through the cavity. The beat note can be directly analyzed without requiring further calibration of system parameters. We apply the method to measure the residual phase noise of an external-cavity diode laser (ECDL) locked to a reference cavity and compare the results with an analysis of the in-loop error signal of the feedback system. (C) 2019 Optical Society of America
Dokumententyp: | Zeitschriftenartikel |
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Fakultät: | Physik |
Themengebiete: | 500 Naturwissenschaften und Mathematik > 530 Physik |
ISSN: | 0146-9592 |
Sprache: | Englisch |
Dokumenten ID: | 82819 |
Datum der Veröffentlichung auf Open Access LMU: | 15. Dez. 2021, 15:03 |
Letzte Änderungen: | 15. Dez. 2021, 15:03 |