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Garg, R.; Bhardwaj, V.; Singh, J. B.; Adachi, I.; Ahn, J. K.; Aihara, H.; Al Said, S.; Asner, D. M.; Aulchenko, V.; Aushev, T.; Ayad, R.; Babu, V.; Bahinipati, S.; Bansal, V.; Beleno, C.; Bilka, T.; Biswal, J.; Bobrov, A.; Bozek, A.; Bracko, M.; Cao, L.; Cervenkov, D.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, H. E.; Cho, K.; Choi, S-K.; Choi, Y.; Cinabro, D.; Cunliffe, S.; Dash, N.; Di Carlo, S.; Dolezal, Z.; Dong, T. V.; Drasal, Z.; Eidelman, S.; Fast, J. E.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Giri, A.; Golob, B.; Grzymkowska, O.; Haba, J.; Hayasaka, K.; Hayashii, H.; Hou, W-S.; Hsu, C-L.; Inami, K.; Inguglia, G.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jeon, H. B.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Julius, T.; Kaliyar, A. B.; Kawasaki, T.; Kichimi, H.; Kim, D. Y.; Kim, J. B.; Kim, S. H.; Kinoshita, K.; Kodys, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Kröger, R.; Krokovny, P.; Kuhr, T.; Kumar, R.; Kwon, Y-J.; Lange, J. S.; Lee, J. K.; Lee, S. C.; Li, C. H.; Li, L. K.; Li, Y. B.; Gioi, L. Li; Libby, J.; Liventsev, D.; Lu, P-C.; Luo, T.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Matvienko, D.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mori, T.; Mussa, R.; Nakao, M.; Nath, K. J.; Nayak, M.; Nishida, S.; Nishimura, K.; Ogawa, S.; Ono, H.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Patra, S.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Popov, V.; Prasanth, K.; Prencipe, E.; Resmi, P. K.; Rostomyan, A.; Russo, G.; Sakai, Y.; Salehi, M.; Sandilya, S.; Sanuki, T.; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shebalin, V.; Shen, C. P.; Shibata, T-A.; Shiu, J-G.; Sokolov, A.; Solovieva, E.; Staric, M.; Stottler, Z. S.; Sumihama, M.; Sumiyoshi, T.; Takizawa, M.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Usov, Y.; Van Tonder, R.; Varner, G.; Varvell, K. E.; Waheed, E.; Wang, B.; Wang, C. H.; Wang, M-Z.; Wang, P.; Wang, X. L.; Watanabe, M.; Won, E.; Yang, S. B.; Ye, H.; Yelton, J.; Yin, J. H.; Yuan, C. Z.; Zhang, Z. P.; Zhilich, V.; Zhukova, V. and Zhulanov, V. (2019): Search for the B -> Y(4260)K, Y(4260) -> J/psi pi(+)pi(-) decays. In: Physical Review D, Vol. 99, No. 7, 071102

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Abstract

We report the results of a search for the B -> Y(4260)K, Y(4260) -> J/psi pi(+)pi thorn p-decays. This study is based on a data sample corresponding to an integrated luminosity of 711 fb(-1), collected at the Upsilon(4S) resonance with the Belle detector at the KEKB asymmetric-energy e(+)e(-) collider. We investigate the J/psi pi(+)pi(-) thorn p-invariant mass distribution in the range 4.0 to 4.6 GeV/c(2) using both B+ -> J/psi pi(+)pi K--(+) and B-0 -> J/psi pi(+)pi K--(S)0 decays. We find excesses of events above the background levels, with significances of 2.1 and 0.9 standard deviations for charged and neutral B -> Y(4260)K decays, respectively, taking into account the systematic uncertainties. These correspond to upper limits on the product of branching fractions, B(B+ -> Y(4260)K+) x B(Y(4260) -> J/psi pi(+)pi(-)) < 1.4 x 10(-5) and B(B-0 -> Y(4260)K-0) x B(Y(4260) -> J/psi pi(+)pi(-)) < 1.7 x 10(-5) at the 90% confidence level.

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