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Li, Y. B.; Shen, C. P.; Yuan, C. Z.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Aushev, T.; Ayad, R.; Badhrees, I.; Ban, Y.; Bansal, V.; Beleno, C.; Berger, M.; Bhardwaj, V.; Bhuyan, B.; Bilka, T.; Biswal, J.; Bondar, A.; Bozek, A.; Bracko, M.; Cao, L.; Cervenkov, D.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, K.; Choi, S. -K.; Choi, Y.; Cinabro, D.; Cunliffe, S.; Di Carlo, S.; Dolezal, Z.; Dong, T. V.; Drasal, Z.; Eidelman, S.; Fast, J. E.; Fulsom, B. G.; Garg, R.; Gaur, V.; Gabyshev, N.; Garmash, A.; Giri, A.; Goldenzweig, P.; Greenwald, D.; Grube, B.; Hayasaka, K.; Hayashii, H.; Hsu, C. -L.; Iijima, T.; Inami, K.; Inguglia, G.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Karyan, G.; Kawasaki, T.; Kichimi, H.; Kim, D. Y.; Kim, H. J.; Kim, J. B.; Kim, K. T.; Kim, S. H.; Kinoshita, K.; Kodys, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Kröger, R.; Krokovny, P.; Kumita, T.; Kuzmin, A.; Kwon, Y. -J.; Lee, J. Y.; Lee, S. C.; Li, L. K.; Li Gioi, L.; Libby, J.; Liventsev, D.; Lubej, M.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mussa, R.; Nakano, E.; Nakao, M.; Nath, K. J.; Nayak, M.; Niiyama, M.; Nishida, S.; Ono, H.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Park, S. -H.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Popov, V.; Prencipe, E.; Russo, G.; Sakai, Y.; Salehi, M.; Sandilya, S.; Santelj, L.; Sanuki, T.; Savinov, V.; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Schwartz, A. J.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shibata, T. -A.; Shiu, J. -G.; Shwartz, B.; Solovieva, E.; Staric, M.; Sumihama, M.; Sumiyoshi, T.; Sutcliffe, W.; Takizawa, M.; Tanida, K.; Tao, Y.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Urquijo, P.; Van Tonder, R.; Varner, G.; Wang, B.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Wang, X. L.; Won, E.; Yang, S. B.; Ye, H.; Yelton, J.; Yin, J. H.; Yusa, Y.; Zhang, Z. P.; Zhilich, V. and Zhukova, V. (2019): First Measurements of Absolute Branching Fractions of the Xi(0)(c) Baryon at Belle. In: Physical Review Letters, Vol. 122, No. 8, 082001

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Abstract

We present the first measurements of absolute branching fractions of Xi(0)(c) decays into Xi(-)pi(+), Lambda K-pi(+), and pK(-)K(-)pi(+) final states. The measurements are made using a dataset comprising (772 +/- 11) x 10(6) B (B) over bar pairs collected at the (sic)(4S) resonance with the Belle detector at the KEKB e(+)e(-)collider. We first measure the absolute branching fraction for B- -> (Lambda) over bar (-)(c)Xi(0)(c) using a missing-mass technique;the result is B(B- -> (Lambda) over bar (-)(c)Xi(0)(c)) = (9.51 +/- 2.10 +/- 0.88) x 10(-4). We subsequently measure the product branching fractions B(B- -> (Lambda) over bar (-)(c)Xi(0)(c))B(Xi(0)(c) -> Xi(-)pi(+)), B(B- -> (Lambda) over bar (-)(c)Xi(0)(c))B(Xi(0)(c) -> Lambda K-pi(+)), and B(B- -> (Lambda) over bar (-)(c)Xi(0)(c))B(Xi(0)(c) -> pK(-)K(-)pi(+)) with improved precision. Dividing these product branching fractions by the result for B- -> (Lambda) over bar (-)(c)Xi(0)(c) yields the following branching fractions: B(Xi(0)(c) -> Xi(-)pi(+)) = (1.80 +/- 0.50 +/- 0.14)%, B(Xi(0)(c) -> Lambda K-pi(+)) = (1.17 +/- 0.37 +/- 0.09)%, and B(Xi(0)(c) -> pK(-)K(-)pi(+) ) = 0.58 +/- 0.23 +/- 0.05)%. For the above branching fractions, the first uncertainties are statistical and the second are systematic. Our result for B(Xi(0)(c) -> Xi(-)pi(+)) can be combined with Xi(0)(c) branching fractions measured relative to Xi(0)(c) -> Xi(-)pi(+) to yield other absolute Xi(0)(c) branching fractions.

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