Thickness-Dependence of Exciton-Exciton Annihilation in Halide Perovskite Nanoplatelets

Gramlich, Moritz; Bohn, Bernhard J.; Tong, Yu; Polavarapu, Lakshminarayana; Feldmann, Jochen und Urban, Alexander S. (2020): Thickness-Dependence of Exciton-Exciton Annihilation in Halide Perovskite Nanoplatelets. In: Journal of Physical Chemistry Letters, Bd. 11, Nr. 13: S. 5361-5366

Abstract

Exciton-exciton annihilation (EEA) and Auger recombination are detrimental processes occurring in semiconductor optoelectronic devices at high carrier densities. Despite constituting one of the main obstacles for realizing lasing in semiconductor nanocrystals (NCs), the dependencies on NC size are not fully understood, especially for those with both weakly and strongly confined dimensions. Here, we use differential transmission spectroscopy to investigate the dependence of EEA on the physical dimensions of thickness-controlled 2D halide perovskite nanoplatelets (NPIs). We find the EEA lifetimes to be extremely short on the order of 7-60 ps. Moreover, they are strongly determined by the NP1 thickness with a power law dependence according to tau(2) proportional to d(5.3). Additional measurements show that the EEA lifetimes also increase for NPIs with larger lateral dimensions. dimensions is critical for deciphering the fundamental laws governing These results show that a precise control of the physical the process especially in 1D and 2D NCs.

• Dokumententyp: Zeitschriftenartikel
• Fakultät: Physik
• Themengebiete: 500 Naturwissenschaften und Mathematik > 530 Physik
• ISSN: 1948-7185
• Sprache: Englisch