Logo Logo
Help
Contact
Switch Language to German

Prim, M. T.; Bernlochner, F. U.; Prim, F. U. M. T.; Goldenzweig, P.; Heck, M.; Adachi, I.; Adamczyk, K.; Aihara, H.; Al Said, S.; Asner, D. M.; Atmacan, H.; Aulchenko, V; Aushev, T.; Ayad, R.; Babu, V.; Bakich, A. M.; Bansal, V.; Behera, P.; Beleno, C.; Bhardwaj, V.; Bhuyan, B.; Bilka, T.; Biswal, J.; Bobrov, A.; Bozek, A.; Bracko, M.; Braun, N.; Browder, T. E.; Campajola, M.; Cao, L.; Cervenkov, D.; Chang, P.; Chekelian, V; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, H. E.; Cho, K.; Choi, Y.; Choudhury, S.; Cinabro, D.; Cunliffe, S.; Dolezal, Z.; Eidelman, S.; Epifanov, D.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Garg, R.; Gaur, V; Garmash, A.; Giri, A.; Grzymkowska, O.; Guan, Y.; Haba, J.; Hara, T.; Hayasaka, K.; Hayashii, H.; Hou, W.-S.; Iijima, T.; Inami, K.; Inguglia, G.; Ishikawa, A.; Iwasaki, M.; Iwasaki, Y.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Kaliyar, A. B.; Karyan, G.; Kawasaki, T.; Kichimi, H.; Kiesling, C.; Kim, C. H.; Kim, D. Y.; Kim, K. T.; Kim, S. H.; Kinoshita, K.; Kody, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Kroeger, R.; Krokovny, P.; Kuhr, T.; Kulasiri, R.; Kumar, R.; Kumita, T.; Kuzmin, A.; Kwon, Y-J; Lalwani, K.; Lange, J. S.; Lee, I. S.; Lee, J. K.; Lee, J. Y.; Lee, S. C.; Lewis, P.; Li, C. H.; Li Gioi, L.; Libby, J.; Lieret, K.; Liventsev, D.; Lu, P-C; Luo, T.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Matvienko, D.; Merola, M.; Metzner, F.; Miyabayashi, K.; Mizuk, R.; Mohanty, G. B.; Mussa, R.; Nakao, M.; De Nardo, G.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Niiyama, M.; Nisar, N. K.; Nishida, S.; Nishimura, K.; Ogawa, S.; Ono, H.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Park, H.; Park, S.-H.; Patra, S.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Popov, V.; Prencipe, E.; Ritter, M.; Rostomyan, A.; Rozanska, M.; Russo, G.; Sahoo, D.; Sakai, Y.; Santelj, L.; Savinov, V; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shebalin, V; Shiu, J-G; Shwartz, B.; Simon, F.; Sokolov, A.; Solovieva, E.; Staric, M.; Strube, J. F.; Sumihama, M.; Sumiyoshi, T.; Sutcliffe, W.; Takizawa, M.; Tamponi, U.; Tao, Y.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Ushiroda, Y.; Usov, Y.; Vahsen, S. E.; Van Tonder, R.; Varner, G.; Varvell, K. E.; Vinokurova, A.; Wang, B.; Wang, C. H.; Wang, M-Z; Wang, P.; Watanuki, S.; Won, E.; Yang, S. B.; Ye, H.; Yin, J. H.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhukova, V and Zhulanov, V (2020): Search for B+ -> mu(+)nu(mu) and B+ -> mu N+ with inclusive tagging. In: Physical Review D, Vol. 101, No. 3, 032007

Full text not available from 'Open Access LMU'.

Abstract

We report the result for a search for the leptonic decay of B+ -> mu(+)nu mu using the full Belle dataset of 711 fb(-1) of integrated luminosity at the gamma(4S) resonance. In the Standard Model leptonic B-meson decays are helicity and Cabibbo-Kobayashi-Maskawa suppressed. To maximize sensitivity an inclusive tagging approach is used to reconstruct the second B meson produced in the collision. The directional information from this second B meson is used to boost the observed mu into the signal B-meson rest frame, in which the mu has a monochromatic momentum spectrum. Though its momentum is smeared by the experimental resolution, this technique improves the analysis sensitivity considerably. Analyzing the mu momentum spectrum in this frame we find B(B+ -> mu(+)nu mu)=(5.3 +/- 2.0 +/- 0.9) x 10(-7) with a one-sided significance of 2.8 standard deviations over the background-only hypothesis. This translates to a frequentist upper limit of B(B+ -> mu(+)nu mu) < 8.6 x 10(-7) at 90% confidence level. The experimental spectrum is then used to search for a massive sterile neutrino, B+ -> mu N+, but no evidence is observed for a sterile neutrino with a mass in a range of 01.5 GeV. The determined B+ -> mu(+)nu mu branching fraction limit is further used to constrain the mass and coupling space of the type II and type III two-Higgs-doublet models.

Actions (login required)

View Item View Item