Logo Logo
Hilfe
Hilfe
Switch Language to English

Li, Y.; Jia, S.; Shen, C. P.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Aushev, T.; Ayad, R.; Babu, V.; Bahinipati, S.; Behera, P.; Belous, K.; Bennett, J.; Bessner, M.; Bhardwaj, V.; Bhuyan, B.; Bilka, T.; Biswal, J.; Bonvicini, G.; Bozek, A.; Bracko, M.; Browder, T. E.; Campajola, M.; Cervenkov, D.; Chang, M-C; Chang, P.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, K.; Cho, S.-J.; Choi, S.-K.; Choi, Y.; Choudhury, S.; Cinabro, D.; Cunliffe, S.; Das, S.; Dash, N.; De Nardo, G.; Di Capua, F.; Dingfelder, J.; Dolezal, Z.; Dong, T. V.; Eidelman, S.; Epifanov, D.; Ferber, T.; Fulsom, B. G.; Garg, R.; Gaur, V.; Garmash, A.; Giri, A.; Goldenzweig, P.; Guan, Y.; Hadjivasiliou, C.; Hartbrich, O.; Hayasaka, K.; Hayashii, H.; Hedges, M. T.; Hou, W.-S.; Hsu, C.-L.; Inami, K.; Inguglia, G.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jeon, H. B.; Jin, Y.; Joo, C. W.; Joo, K. K.; Kaliyar, A. B.; Kang, K. H.; Karyan, G.; Kawasaki, T.; Kiesling, C.; Kim, D. Y.; Kim, K-H; Kim, S. H.; Kim, Y-K; Kinoshita, K.; Kodys, P.; Konno, T.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Kroeger, R.; Krokovny, P.; Kuhr, T.; Kulasiri, R.; Kumar, M.; Kumar, R.; Kumara, K.; Kwon, Y-J; Lalwani, K.; Lange, J. S.; Lee, I. S.; Lee, S. C.; Li, C. H.; Li, J.; Li, L. K.; Li, Y. B.; Gioi, L. Li; Libby, J.; Lieret, K.; Liptak, Z.; MacQueen, C.; Masuda, M.; Matsuda, T.; Matvienko, D.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mohanty, S.; Mori, T.; Mussa, R.; Nakao, M.; Natkaniec, Z.; Natochii, A.; Nayak, L.; Nayak, M.; Niiyama, M.; Nisar, N. K.; Nishida, S.; Ono, H.; Onuki, Y.; Oskin, P.; Pakhlov, P.; Pakhlova, G.; Pang, T.; Pardi, S.; Park, H.; Park, S.-H.; Patra, S.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Podobnik, T.; Popov, V.; Prencipe, E.; Prim, M. T.; Ritter, M.; Roehrken, M.; Rostomyan, A.; Rout, N.; Russo, G.; Sahoo, D.; Sakai, Y.; Sandilya, S.; Sangal, A.; Santelj, L.; Sanuki, T.; Savinov, V.; Schnell, G.; Schueler, J.; Schwanda, C.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shapkin, M.; Sharma, C.; Shiu, J-G; Shwartz, B.; Sokolov, A.; Solovieva, E.; Staric, M.; Stottler, Z. S.; Sumihama, M.; Sumisawa, K.; Sumiyoshi, T.; Sutcliffe, W.; Takizawa, M.; Tamponi, U.; Tanida, K.; Tenchini, F.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Vahsen, S. E.; Van Tonder, R.; Varner, G.; Vinokurova, A.; Vorobyev, V.; Wang, C. H.; Wang, E.; Wang, M-Z; Wang, P.; Watanabe, M.; Watanuki, S.; Won, E.; Xu, X.; Yabsley, B. D.; Yan, W.; Yang, S. B.; Ye, H.; Yelton, J.; Yin, J. H.; Yuan, C. Z.; Zhang, Z. P.; Zhilich, V.; Zhukova, V. und Zhulanov, V. (2020): Search for a doubly charged DDK bound state in Upsilon(1S, 2S) inclusive decays and via direct production in e(+)e(-) collisions at root s=10.520, 10.580, and 10.867 GeV. In: Physical Review D, Bd. 102, Nr. 11, 112001

Volltext auf 'Open Access LMU' nicht verfügbar.

Abstract

We report the results of a first search for a doubly charged DDK bound state, denoted the R++, in Upsilon(1S) and Upsilon(2S) inclusive decays and via direct production in e(+)e(-) collisions at root s = 10.520, 10.580, and 10.867 GeV. The search uses data accumulated with the Belle detector at the KEKB asymmetric-energy e(+)e(-) collider. No significant signals are observed in the D+Ds*(+) invariant-mass spectra of all studied modes. The 90% credibility level upper limits on their product branching fractions in Upsilon(1S) and Upsilon(2S) inclusive decays (B(Upsilon(1S, 2S) -4 R++ + anything) x B(R++ -> D+D-s*(+))), the product values of Born cross section and branching fraction in e(+)e(-) collisions (sigma(e(+)e(-) -> R++ + anything) x B(R++ -> D+D-s*(+))) at root s = 10.520, 10.580, and 10.867 GeV under different assumptions of R++ masses varying from 4.13 to 4.17 GeV/c(2) and widths varying from 0 to 5 MeV are obtained.

Dokument bearbeiten Dokument bearbeiten