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Montañes, Elena; Senge, Robin; Barranquero, Jose; Ramón Quevedo, José; José del Coz, Juan and Hüllermeier, Eyke ORCID logoORCID: https://orcid.org/0000-0002-9944-4108 (2014): Dependent binary relevance models for multi-label classification. In: Pattern Recognition, Vol. 47, No. 3: pp. 1494-1508

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