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Dembczyński, Krzysztof; Waegeman, Willem; Cheng, Weiwei and Hüllermeier, Eyke ORCID logoORCID: https://orcid.org/0000-0002-9944-4108 (2012): On label dependence and loss minimization in multi-label classification. In: Machine Learning, Vol. 88, No. 1-2: pp. 5-45

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