Dembczyński, Krzysztof; Waegeman, Willem; Cheng, Weiwei and Hüllermeier, Eyke
ORCID: https://orcid.org/0000-0002-9944-4108
(2010):
Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.
In: Balcázar, José Luis; Bonchi, Francesco; Gionis, Aristides and Sebag, Michèle (eds.) :
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I. Lecture Notes in Computer Science, Vol. 6321. Berlin, Heidelberg: Springer. pp. 280-295
| Item Type: | Book Section |
|---|---|
| Faculties: | Mathematics, Computer Science and Statistics > Computer Science > Artificial Intelligence and Machine Learning |
| Subjects: | 000 Computer science, information and general works > 004 Data processing computer science |
| ISBN: | 978-3-642-15879-7 ; 978-3-642-15880-3 |
| Place of Publication: | Berlin, Heidelberg |
| Language: | English |
| Item ID: | 91772 |
| Date Deposited: | 05. Apr 2022, 09:16 |
| Last Modified: | 05. Apr 2022, 09:16 |
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