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Dembczyński, Krzysztof; Waegeman, Willem; Cheng, Weiwei and Hüllermeier, Eyke ORCID logoORCID: https://orcid.org/0000-0002-9944-4108 (2010): Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss. In: Balcázar, José Luis; Bonchi, Francesco; Gionis, Aristides and Sebag, Michèle (eds.) : Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I. Lecture Notes in Computer Science, Vol. 6321. Berlin, Heidelberg: Springer. pp. 280-295

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