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Dembczyński, Krzysztof; Jachnik, Arkadiusz; Kotlowski, Wojciech; Waegeman, Willem and Hüllermeier, Eyke ORCID logoORCID: https://orcid.org/0000-0002-9944-4108 (2013): Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization. ICML'13: 30th International Conference on International Conference on Machine Learning, Atlanta GA USA, June 16 - 21, 2013. Dasgupta, Sanjoy and McAllester, David (eds.) : In: Proceedings of the 30th International Conference on Machine Learning, Vol. 28, No. 3 pp. 1030-1038

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