Logo Logo
Help
Contact
Switch Language to German
Dembczyński, Krzysztof; Jachnik, Arkadiusz; Kotlowski, Wojciech; Waegeman, Willem; Hüllermeier, Eyke ORCID: 0000-0002-9944-4108 (2013): Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization. ICML'13: 30th International Conference on International Conference on Machine Learning, June 16 - 21, 2013, Atlanta GA USA.
Full text not available from 'Open Access LMU'.