Logo Logo
Switch Language to German

Dembczyński, Krzysztof; Jachnik, Arkadiusz; Kotlowski, Wojciech; Waegeman, Willem and Hüllermeier, Eyke ORCID logoORCID: https://orcid.org/0000-0002-9944-4108 (2013): Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization. In: Dasgupta, Sanjoy and McAllester, David (eds.) : Proceedings of the 30th International Conference on Machine Learning. pp. 1030-1038

Full text not available from 'Open Access LMU'.

Actions (login required)

View Item View Item