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Cheng, Weiwei; Hüllermeier, Eyke ORCID: 0000-0002-9944-4108 (2009): Combining Instance-Based Learning and Logistic Regression for Multilabel Classification. In: Buntine, Wray; Grobelnik, Marko; Mladenić, Dunja; Shawe-Taylor, John (eds.) : Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2009, Bled, Slovenia, September 7-11, 2009, Proceedings, Part I. Lecture Notes in Computer Science, Vol. 5781. Berlin, Heidelberg: Springer. p. 6
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