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Journal article

Grieb, Tim; Krause, Florian F.; Mueller-Caspary, Knut; Ahl, Jan-Philipp; Schowalter, Marco; Oppermann, Oliver; Hertkorn, Joachim; Engl, Karl und Rosenauer, Andreas (2022): Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN. In: Ultramicroscopy, Vol. 238, 113535

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