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Journal article
Grieb, Tim; Krause, Florian F.; Mueller-Caspary, Knut; Ahl, Jan-Philipp; Schowalter, Marco; Oppermann, Oliver; Hertkorn, Joachim; Engl, Karl und Rosenauer, Andreas
(2022):
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.
In: Ultramicroscopy, Vol. 238, 113535
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