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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 3
2025
Lorenzen, Tizian 
ORCID: https://orcid.org/0009-0003-3082-6540; Diederichs, Benedikt ORCID: https://orcid.org/0009-0002-2301-9583; Otieno Ogolla, Charles ORCID: https://orcid.org/0000-0001-9507-3576; Butz, Benjamin ORCID: https://orcid.org/0000-0002-9744-3419 und Müller-Caspary, Knut ORCID: https://orcid.org/0000-0002-2588-7993
(2025):
Aberration measurement by electron ptychography and consistency among different algorithms.
In: Applied Physics Letters, Bd. 126, Nr. 8, 081602
[PDF, 3MB]
ORCID: https://orcid.org/0009-0003-3082-6540; Diederichs, Benedikt ORCID: https://orcid.org/0009-0002-2301-9583; Otieno Ogolla, Charles ORCID: https://orcid.org/0000-0001-9507-3576; Butz, Benjamin ORCID: https://orcid.org/0000-0002-9744-3419 und Müller-Caspary, Knut ORCID: https://orcid.org/0000-0002-2588-7993
(2025):
Aberration measurement by electron ptychography and consistency among different algorithms.
In: Applied Physics Letters, Bd. 126, Nr. 8, 081602
[PDF, 3MB]
2024
Leidl, Max Leo; Diederichs, Benedikt; Sachse, Carsten und Müller-Caspary, Knut ORCID: https://orcid.org/0000-0002-2588-7993
(2024):
Influence of loss function and electron dose on ptychography of 2D materials using the Wirtinger flow.
In: Micron, Bd. 185, 103688
[PDF, 12MB]
ORCID: https://orcid.org/0000-0002-2588-7993
(2024):
Influence of loss function and electron dose on ptychography of 2D materials using the Wirtinger flow.
In: Micron, Bd. 185, 103688
[PDF, 12MB]
2022
Bangun, Arya; Melnyk, Oleh; Maerz, Benjamin; Diederichs, Benedikt; Clausen, Alexander; Weber, Dieter; Filbir, Frank und Mueller-Caspary, Knut
(2022):
Inverse Multislice Ptychography by Layer-Wise Optimisation and Sparse Matrix Decomposition.
In: IEEE Transactions on Computational Imaging, Bd. 8: S. 996-1011