![[höher]](/style/images/multi_up.png)
Eine Ebene höherGruppiert nach:
Dokumententyp
| Veröffentlichungsdatum
Springe zu: Zeitschriftenartikel
Anzahl der Publikationen: 4
Zeitschriftenartikel
Cattaneo, Mauricio; Müller-Caspary, Knut 
ORCID: https://orcid.org/0000-0002-2588-7993; Barthel, Juri ORCID: https://orcid.org/0000-0003-3914-4346; MacArthur, Katherine E.; Gauquelin, Nicolas; Lipinska-Chwalek, Marta; Verbeeck, Johan; Allen, Leslie J. und Dunin-Borkowski, Rafal E.
(2024):
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy.
In: Ultramicroscopy, Bd. 267, 114050
[PDF, 3MB]
ORCID: https://orcid.org/0000-0002-2588-7993; Barthel, Juri ORCID: https://orcid.org/0000-0003-3914-4346; MacArthur, Katherine E.; Gauquelin, Nicolas; Lipinska-Chwalek, Marta; Verbeeck, Johan; Allen, Leslie J. und Dunin-Borkowski, Rafal E.
(2024):
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy.
In: Ultramicroscopy, Bd. 267, 114050
[PDF, 3MB]
Schmitt, Maurice; Denneulin, Thibaud; Kovacs, Andras; Saunderson, Tom G.; Ruessmann, Philipp; Shahee, Aga; Scholz, Tanja; Tavabi, Amir H.; Gradhand, Martin; Mavropoulos, Phivos; Lotsch, Bettina V.; Dunin-Borkowski, Rafal E.; Mokrousov, Yuriy; Bluegel, Stefan und Klaeui, Mathias
(2022):
Skyrmionic spin structures in layered Fe5GeTe2 up to room temperature.
In: Communications Physics, Bd. 5, Nr. 1, 254
Wessels, Teresa; Daester, Simon; Murooka, Yoshie; Zingsem, Benjamin; Migunov, Vadim; Kruth, Maximilian; Finizio, Simone; Lu, Peng-Han; Kovacs, Andras; Oelsner, Andreas; Mueller-Caspary, Knut; Acremann, Yves und Dunin-Borkowski, Rafal E.
(2022):
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope.
In: Ultramicroscopy, Bd. 233, 113392
Denneulin, Thibaud; Caron, Jan; Mueller-Caspary, Knut; Boulle, Olivier; Kovacs, Andras und Dunin-Borkowski, Rafal E.
(2021):
Visibility and Apparent Size of Neel-Type Magnetic Skyrmions in Fresnel Defocus Images of Multilayer Films.
In: Microscopy and Microanalysis, Bd. 27, Nr. 6: S. 1356-1365