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Gruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 3
2020
Wever, Marcel 
ORCID: https://orcid.org/0000-0001-9782-6818; Tornede, Alexander ORCID: https://orcid.org/0000-0002-2415-2186; Mohr, Felix und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(April 2020):
LiBRe: Label-Wise Selection of Base Learners in Binary Relevance for Multi-label Classification.
In: Berthold, Michael; Feelders, Ad und Krempl, Georg (Hrsg.): (2020):
Advances in Intelligent Data Analysis XVIII. 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27–29, 2020, Proceedings. Lecture Notes in Computer Science, Bd. 12080. New York, NY: Association for Computing Machinery. S. 561-573
[PDF, 425kB]
ORCID: https://orcid.org/0000-0001-9782-6818; Tornede, Alexander ORCID: https://orcid.org/0000-0002-2415-2186; Mohr, Felix und Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(April 2020):
LiBRe: Label-Wise Selection of Base Learners in Binary Relevance for Multi-label Classification.
In: Berthold, Michael; Feelders, Ad und Krempl, Georg (Hrsg.): (2020):
Advances in Intelligent Data Analysis XVIII. 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27–29, 2020, Proceedings. Lecture Notes in Computer Science, Bd. 12080. New York, NY: Association for Computing Machinery. S. 561-573
[PDF, 425kB]
2005
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Fürnkranz, Johannes
(September 2005):
Learning Label Preferences: Ranking Error Versus Position Error.
In: Fazel Famili, A.; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings. Lecture Notes in Computer Science, Bd. 3646. Berlin, Heidelberg: Springer. S. 180-191
ORCID: https://orcid.org/0000-0002-9944-4108 und Fürnkranz, Johannes
(September 2005):
Learning Label Preferences: Ranking Error Versus Position Error.
In: Fazel Famili, A.; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings. Lecture Notes in Computer Science, Bd. 3646. Berlin, Heidelberg: Springer. S. 180-191
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Beringer, Jürgen
(September 2005):
Learning from Ambiguously Labeled Examples.
In: Famili, A. Fazel; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. Lecture Notes in Computer Science. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings, Bd. 3646. Berlin, Heidelberg: Springer. S. 168-179
ORCID: https://orcid.org/0000-0002-9944-4108 und Beringer, Jürgen
(September 2005):
Learning from Ambiguously Labeled Examples.
In: Famili, A. Fazel; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. Lecture Notes in Computer Science. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings, Bd. 3646. Berlin, Heidelberg: Springer. S. 168-179