|
Eine Ebene nach oben |
Gruppiert nach:
Dokumententyp
| Veröffentlichungsdatum
Springe zu: Zeitschriftenartikel
Anzahl der Publikationen: 4
Zeitschriftenartikel
Rosenberger, Philipp; Rupp, Philipp; Ali, Rami; Alghabra, M. Said; Sun, Shaohua; Mitra, Sambit; Khan, Sharjeel A.; Dagar, Ritika; Kim, Vyacheslav; Iqbal, Mazhar; Schotz, Johannes; Liu, Qingcao; Sundaram, Shanmugavelayutham K.; Kredel, Julia; Gallei, Markus; Costa-Vera, Cesar; Bergues, Boris; Alnaser, Ali S. und Kling, Matthias F.
(2020):
Near-Field Induced Reaction Yields from Nanoparticle Clusters.
In: ACS Photonics, Bd. 7, Nr. 7: S. 1885-1892
Liu, Qingcao; Zherebtsov, Sergey; Seiffert, Lennart; Skruszewicz, Slawomir; Zietlow, Dominik; Ahn, Seongjin; Rupp, Philipp; Wnuk, Pawel; Sun, Shaohua; Kessel, Alexander; Trushin, Sergei; Schlander, Annika; Kim, Dongeon; Ruehl, Eckart; Ciappina, Marcelo F.; Tiggesbaeumker, Josef; Gallei, Markus; Fennel, Thomas und Kling, Matthias F.
(2019):
All-optical spatio-temporal control of electron emission from SiO2 nanospheres with femtosecond two-color laser fields.
In: New Journal of Physics, Bd. 21, 073011
Rupp, Philipp; Burger, Christian; Kling, Nora G.; Kuebel, Matthias; Mitra, Sambit; Rosenberger, Philipp; Weatherby, Thomas; Saito, Nariyuki; Itatani, Jiro; Alnaser, Ali S.; Raschke, Markus B.; Ruehl, Eckart; Schlander, Annika; Gallei, Markus; Seiffert, Lennart; Fennel, Thomas; Bergues, Boris und Kling, Matthias F.
(2019):
Few-cycle laser driven reaction nanoscopy on aerosolized silica nanoparticles.
In: Nature Communications, Bd. 10, 4655
[PDF, 2MB]
Rupp, Philipp; Seiffert, Lennart; Liu, Qingcao; Süßmann, Frederik; Ahn, Byungnam; Förg, Benjamin; Schäfer, Christian G.; Gallei, Markus; Mondes, Valerie; Kessel, Alexander; Trushin, Sergei; Graf, Christina; Rühl, Eckart; Lee, Jinwoo; Kim, Min Su; Kim, Dong Eon; Fennel, Thomas; Kling, Matthias F. und Zherebtsov, Sergey
(2017):
Quenching of material dependence in few-cycle driven electron acceleration from nanoparticles under many-particle charge interaction.
In: Journal of Modern Optics, Bd. 64, Nr. 43414: S. 995-1003