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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 4
2020
Splinter, Mona; Sachpazidis, Ilias; Bostel, Tilman; Fechter, Tobias; Zamboglou, Constantinos; Thieke, Christian; Jaekel, Oliver; Huber, Peter E.; Debus, Jürgen; Baltas, Dimos und Nicolay, Nils H.
(September 2020):
Dosimetric Impact of the Positional Imaging Frequency for Hypofractionated Prostate Radiotherapy – A Voxel-by-Voxel Analysis.
In: Frontiers in Oncology, Bd. 10, 564068: S. 1-11
[PDF, 2MB]
Hoffmann, Aswin; Oborn, Bradley; Moteabbed, Maryam; Yan, Susu; Bortfeld, Thomas; Knopf, Antje; Fuchs, Herman; Georg, Dietmar; Seco, Joao; Spadea, Maria Francesca; Jaekel, Oliver; Kurz, Christopher und Parodi, Katia
(2020):
MR-guided proton therapy: a review and a preview.
In: Radiation Oncology, Bd. 15, Nr. 1, 129
2018
Mattke, Matthias; Vogt, Kira; Bougatf, Nina; Welzel, Thomas; Oelmann-Avendano, Jan; Hauswald, Henrik; Jensen, Alexandra; Ellerbrock, Malte; Jaekel, Oliver; Haberer, Thomas; Herfarth, Klaus; Debus, Jürgen und Uhl, Matthias
(2018):
High Control Rates of Proton- and Carbon-Ion-Beam Treatment With Intensity-Modulated Active Raster Scanning in 101 Patients With Skull Base Chondrosarcoma at the Heidelberg Ion Beam Therapy Center.
In: Cancer, Bd. 124, Nr. 9: S. 2036-2044
2016
Meyer, Sebastian; Magallanes, Lorena; Kopp, Benedikt; Tessonnier, Thomas; Landry, Guillaume; Dedes, George; Voss, Bernd; Jaekel, Oliver; Belka, Claus; Gianoli, Chiara und Parodi, Katia 
ORCID: https://orcid.org/0000-0001-7779-6690
(2016):
Tomographic Imaging with Carbon Ion Beams.
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29. Oktober - 6. November 2016.
New York: IEEE.
ORCID: https://orcid.org/0000-0001-7779-6690
(2016):
Tomographic Imaging with Carbon Ion Beams.
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29. Oktober - 6. November 2016.
New York: IEEE.