|
Eine Ebene nach oben |
Gruppiert nach:
Dokumententyp
| Veröffentlichungsdatum
Springe zu: Zeitschriftenartikel | Konferenzbeitrag
Anzahl der Publikationen: 5
Zeitschriftenartikel
Beyer, Dirk und Jakobs, Marie-Christine
(2021):
Cooperative verifier-based testing with CoVeriTest.
In: International Journal on Software Tools for Technology Transfer, Bd. 23, Nr. 3: S. 313-333
Richter, Cedric; Hüllermeier, Eyke 
ORCID: https://orcid.org/0000-0002-9944-4108; Jakobs, Marie-Christine und Wehrheim, Heike
(April 2020):
Algorithm selection for software validation based on graph kernels.
In: Automated Software Engineering, Bd. 27, Nr. 1-2: S. 153-186
ORCID: https://orcid.org/0000-0002-9944-4108; Jakobs, Marie-Christine und Wehrheim, Heike
(April 2020):
Algorithm selection for software validation based on graph kernels.
In: Automated Software Engineering, Bd. 27, Nr. 1-2: S. 153-186
Jakobs, Marie-Christine
(2020):
CoVeriTest: interleaving value and predicate analysis for test-case generation.
In: International Journal on Software Tools for Technology Transfer
Beyer, Dirk; Jakobs, Marie-Christine; Lemberger, Thomas und Wehrheim, Heike
(2018):
Reducer-Based Construction of Conditional Verifiers.
In: Proceedings 2018 Ieee/Acm 40Th International Conference on Software Engineering (Icse): S. 1182-1193
Konferenzbeitrag
Czech, Mike; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108; Jakobs, Marie-Christine und Wehrheim, Heike
(2017):
Predicting rankings of software verification tools.
3rd ACM SIGSOFT International Workshop on Software Analytics, Paderborn, Germany, 4 September 2017.
Baysal, Olga (Hrsg.):
In: Proceedings of the 3rd ACM SIGSOFT International Workshop on Software Analytics,
ACM: New York, NY. S. 23-26
ORCID: https://orcid.org/0000-0002-9944-4108; Jakobs, Marie-Christine und Wehrheim, Heike
(2017):
Predicting rankings of software verification tools.
3rd ACM SIGSOFT International Workshop on Software Analytics, Paderborn, Germany, 4 September 2017.
Baysal, Olga (Hrsg.):
In: Proceedings of the 3rd ACM SIGSOFT International Workshop on Software Analytics,
ACM: New York, NY. S. 23-26