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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 5
2007
Sulzmann, Jan-Nikolas; Fürnkranz, Johannes und Hüllermeier, Eyke 
ORCID: https://orcid.org/0000-0002-9944-4108
(2007):
On Pairwise Naive Bayes Classifiers.
In: Kok, Joost N.; Koronacki, Jacek; Lopez de Mantaras, Raomon; Matwin, Stan; Mladenič, Dunja und Skowron, Andrzej (Hrsg.):
Machine Learning: ECML 2007. 18th European Conference on Machine Learning, Warsaw, Poland, September 17-21, 2007. Proceedings. Lecture Notes in Computer Science, Bd. 4701. Berlin, Heidelberg: Springer. S. 371-381
ORCID: https://orcid.org/0000-0002-9944-4108
(2007):
On Pairwise Naive Bayes Classifiers.
In: Kok, Joost N.; Koronacki, Jacek; Lopez de Mantaras, Raomon; Matwin, Stan; Mladenič, Dunja und Skowron, Andrzej (Hrsg.):
Machine Learning: ECML 2007. 18th European Conference on Machine Learning, Warsaw, Poland, September 17-21, 2007. Proceedings. Lecture Notes in Computer Science, Bd. 4701. Berlin, Heidelberg: Springer. S. 371-381
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Fürnkranz, Johannes
(2007):
On Minimizing the Position Error in Label Ranking.
In: Kok, Joost N.; Koronacki, Jacek; Lopez de Mantaras, Raomon; Matwin, Stan; Mladenič, Dunja und Skowron, Andrzej (Hrsg.):
Machine Learning: ECML 2007. 18th European Conference on Machine Learning, Warsaw, Poland, September 17-21, 2007. Proceedings. Lecture Notes in Computer Science, Bd. 4701. Berlin, Heidelberg: Springer. S. 583-590
ORCID: https://orcid.org/0000-0002-9944-4108 und Fürnkranz, Johannes
(2007):
On Minimizing the Position Error in Label Ranking.
In: Kok, Joost N.; Koronacki, Jacek; Lopez de Mantaras, Raomon; Matwin, Stan; Mladenič, Dunja und Skowron, Andrzej (Hrsg.):
Machine Learning: ECML 2007. 18th European Conference on Machine Learning, Warsaw, Poland, September 17-21, 2007. Proceedings. Lecture Notes in Computer Science, Bd. 4701. Berlin, Heidelberg: Springer. S. 583-590
2005
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Fürnkranz, Johannes
(September 2005):
Learning Label Preferences: Ranking Error Versus Position Error.
In: Fazel Famili, A.; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings. Lecture Notes in Computer Science, Bd. 3646. Berlin, Heidelberg: Springer. S. 180-191
ORCID: https://orcid.org/0000-0002-9944-4108 und Fürnkranz, Johannes
(September 2005):
Learning Label Preferences: Ranking Error Versus Position Error.
In: Fazel Famili, A.; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings. Lecture Notes in Computer Science, Bd. 3646. Berlin, Heidelberg: Springer. S. 180-191
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108 und Beringer, Jürgen
(September 2005):
Learning from Ambiguously Labeled Examples.
In: Famili, A. Fazel; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. Lecture Notes in Computer Science. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings, Bd. 3646. Berlin, Heidelberg: Springer. S. 168-179
ORCID: https://orcid.org/0000-0002-9944-4108 und Beringer, Jürgen
(September 2005):
Learning from Ambiguously Labeled Examples.
In: Famili, A. Fazel; Kok, Joost N.; Peña, José M.; Siebes, Arno und Feelders, Ad (Hrsg.):
Advances in Intelligent Data Analysis VI. Lecture Notes in Computer Science. 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedings, Bd. 3646. Berlin, Heidelberg: Springer. S. 168-179
1999
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(1999):
Exploiting Similarity for Supporting Data Analysis and Problem Solving.
In: Hand, David J.; Kok, Joost N. und Berthold, Michael R. (Hrsg.):
Advances in Intelligent Data Analysis. Third International Symposium, IDA-99 Amsterdam, The Netherlands, August 9–11, 1999 Proceedings. Lecture Notes in Computer Science, Bd. 1642. Berlin, Heidelberg: Springer. S. 257-268
ORCID: https://orcid.org/0000-0002-9944-4108
(1999):
Exploiting Similarity for Supporting Data Analysis and Problem Solving.
In: Hand, David J.; Kok, Joost N. und Berthold, Michael R. (Hrsg.):
Advances in Intelligent Data Analysis. Third International Symposium, IDA-99 Amsterdam, The Netherlands, August 9–11, 1999 Proceedings. Lecture Notes in Computer Science, Bd. 1642. Berlin, Heidelberg: Springer. S. 257-268