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Springe zu: Konferenzbeitrag
Anzahl der Publikationen: 5
Konferenzbeitrag
Kotovenko, Dmytro; Ma, Pingchuan; Milbich, Timo und Ommer, Björn 
ORCID: https://orcid.org/0000-0003-0766-120X
(2023):
Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning.
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, BC, Canada, 17-24 June 2023.
In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 11070-11081
ORCID: https://orcid.org/0000-0003-0766-120X
(2023):
Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning.
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, BC, Canada, 17-24 June 2023.
In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 11070-11081
Kotovenko, Dmytro; Ma, Pingchuan; Milbich, Timo ORCID: https://orcid.org/0000-0002-5012-0874 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2023):
Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning.
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, BC, Canada, 17-24 June 2023.
Institute of Electrical and Electronics Engineers (IEEE) (Hrsg.),
In: CR-FIQA: Face Image Quality Assessment by Learning Sample Relative Classifiability,
Piscataway, NJ: IEEE. S. 1170-1181
ORCID: https://orcid.org/0000-0002-5012-0874 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2023):
Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning.
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, BC, Canada, 17-24 June 2023.
Institute of Electrical and Electronics Engineers (IEEE) (Hrsg.),
In: CR-FIQA: Face Image Quality Assessment by Learning Sample Relative Classifiability,
Piscataway, NJ: IEEE. S. 1170-1181
Kotovenko, Dmytro; Wright, Matthias; Heimbrecht, Arthur und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Rethinking Style Transfer: From Pixels to Parameterized Brushstrokes.
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Nashville, TN, USA, 20-25 June 2021.
In: 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 12191-12200
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Rethinking Style Transfer: From Pixels to Parameterized Brushstrokes.
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Nashville, TN, USA, 20-25 June 2021.
In: 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 12191-12200
Kotovenko, Dmytro; Sanakoyeu, Artsiom; Ma, Pingchuan; Lang, Sabine und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
A Content Transformation Block for Image Style Transfer.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 10024-10033
ORCID: https://orcid.org/0000-0003-0766-120X
(2019):
A Content Transformation Block for Image Style Transfer.
2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019.
In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 10024-10033
Sanakoyeu, Artsiom; Kotovenko, Dmytro; Lang, Sabine ORCID: https://orcid.org/0000-0003-2543-0085 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2018):
A Style-Aware Content Loss for Real-Time HD Style Transfer.
15th European Conference on Computer Vision (ECCV), München, 8.-14. September 2018.
Ferrari, Vittorio; Hebert, Martial; Sminchisescu, Cristian und Weiss, Yair (Hrsg.):
In: Computer Vision – ECCV 2018 Proceedings,
Bd. 8
Cham: Springer International Publishing. S. 715-731
ORCID: https://orcid.org/0000-0003-2543-0085 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2018):
A Style-Aware Content Loss for Real-Time HD Style Transfer.
15th European Conference on Computer Vision (ECCV), München, 8.-14. September 2018.
Ferrari, Vittorio; Hebert, Martial; Sminchisescu, Cristian und Weiss, Yair (Hrsg.):
In: Computer Vision – ECCV 2018 Proceedings,
Bd. 8
Cham: Springer International Publishing. S. 715-731