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Gruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Springe zu: 2018
Anzahl der Publikationen: 1
2018
Nguyen, Vu-Linh; Destercke, Sébastien; Masson, Marie-Hélène und Hüllermeier, Eyke 
ORCID: https://orcid.org/0000-0002-9944-4108
(2018):
Reliable Multi-class Classification based on Pairwise Epistemic and Aleatoric Uncertainty.
Twenty-Seventh International Joint Conference on Artificial Intelligence, Stockholm, Sweden, 13-19 July 2018.
Lang, Jérôme (Hrsg.):
In: Proceedings of the Twenty-Seventh International Joint Conference on Artificial Intelligence,
Menlo Park, County of San Mateo, California: S. 5089-5095
ORCID: https://orcid.org/0000-0002-9944-4108
(2018):
Reliable Multi-class Classification based on Pairwise Epistemic and Aleatoric Uncertainty.
Twenty-Seventh International Joint Conference on Artificial Intelligence, Stockholm, Sweden, 13-19 July 2018.
Lang, Jérôme (Hrsg.):
In: Proceedings of the Twenty-Seventh International Joint Conference on Artificial Intelligence,
Menlo Park, County of San Mateo, California: S. 5089-5095