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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Springe zu: 2009
Anzahl der Publikationen: 3
2009
Megerle, U.; Pugliesi, Igor; Schriever, Christian; Sailer, Christian F. und Riedle, Eberhard 
ORCID: https://orcid.org/0000-0002-2672-5718
(August 2009):
Sub-50 fs broadband absorption spectroscopy with tunable excitation: putting the analysis of ultrafast molecular dynamics on solid ground.
In: Applied Physics B: Lasers and Optics, Bd. 96, Nr. 2-3: S. 215-231
ORCID: https://orcid.org/0000-0002-2672-5718
(August 2009):
Sub-50 fs broadband absorption spectroscopy with tunable excitation: putting the analysis of ultrafast molecular dynamics on solid ground.
In: Applied Physics B: Lasers and Optics, Bd. 96, Nr. 2-3: S. 215-231
Pugliesi, Igor; Megerle, U.; Bradler, M. und Riedle, Eberhard ORCID: https://orcid.org/0000-0002-2672-5718
(2009):
New frontiers in ultrafast broadband pump-probe spectroscopy for the investigation of electron transfer processes.
European Quantum Electronics Conference 2009, Munich Germany, 14–19 June 2009.
Conference Digest.
Optical Society of America.
ORCID: https://orcid.org/0000-0002-2672-5718
(2009):
New frontiers in ultrafast broadband pump-probe spectroscopy for the investigation of electron transfer processes.
European Quantum Electronics Conference 2009, Munich Germany, 14–19 June 2009.
Conference Digest.
Optical Society of America.
Pugliesi, Igor; Megerle, U.; Bradler, M. und Riedle, Eberhard ORCID: https://orcid.org/0000-0002-2672-5718
(2009):
New frontiers in ultrafast broadband pump-probe spectroscopy for the investigation of electron transfer processes.
EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference, Munich, Germany, 14-19 June 2009.
IEEE Xplore.
IEEE.
ORCID: https://orcid.org/0000-0002-2672-5718
(2009):
New frontiers in ultrafast broadband pump-probe spectroscopy for the investigation of electron transfer processes.
EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference, Munich, Germany, 14-19 June 2009.
IEEE Xplore.
IEEE.