![[up]](/style/images/multi_up.png)
Up a levelGroup by: Item Type | Date
Number of items: 9.
Journal article
Nguyen, Vu-Linh; Shaker, Mohammad Hossein and Hüllermeier, Eyke 
ORCID: https://orcid.org/0000-0002-9944-4108
(January 2022):
How to measure uncertainty in uncertainty sampling for active learning.
In: Machine Learning, Vol. 111, No. 1: pp. 89-122
ORCID: https://orcid.org/0000-0002-9944-4108
(January 2022):
How to measure uncertainty in uncertainty sampling for active learning.
In: Machine Learning, Vol. 111, No. 1: pp. 89-122
Nguyen, Vu-Linh ORCID: https://orcid.org/0000-0003-1642-4468 and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2. November 2021):
Multilabel Classification with Partial Abstention: Bayes-Optimal Prediction under Label Independence.
In: Journal of Artificial Intelligence Research, Vol. 72: pp. 613-665
ORCID: https://orcid.org/0000-0003-1642-4468 and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2. November 2021):
Multilabel Classification with Partial Abstention: Bayes-Optimal Prediction under Label Independence.
In: Journal of Artificial Intelligence Research, Vol. 72: pp. 613-665
Nguyen, Vu-Linh and Hüllermeier, Eyke
(2021):
Multilabel Classification with Partial Abstention: Bayes-Optimal Prediction under Label Independence.
In: Journal of Artificial Intelligence Research, Vol. 72: pp. 613-665
Book Section
Rapp, Michael ORCID: https://orcid.org/0000-0001-8570-8240; Mencía, Eneldo Loza; Fürnkranz, Johannes; Nguyen, Vu-Linh and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(February 2021):
Learning Gradient Boosted Multi-label Classification Rules.
In: Hutter, Frank; Kersting, Kristian; Lijffijt, Jefrey and Valera, Isabel (eds.) :
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2020, Ghent, Belgium, September 14–18, 2020, Proceedings, Part III. Lecture Notes in Computer Science, Vol. 12459. Cham: Springer. pp. 124-140
ORCID: https://orcid.org/0000-0001-8570-8240; Mencía, Eneldo Loza; Fürnkranz, Johannes; Nguyen, Vu-Linh and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(February 2021):
Learning Gradient Boosted Multi-label Classification Rules.
In: Hutter, Frank; Kersting, Kristian; Lijffijt, Jefrey and Valera, Isabel (eds.) :
Machine Learning and Knowledge Discovery in Databases. European Conference, ECML PKDD 2020, Ghent, Belgium, September 14–18, 2020, Proceedings, Part III. Lecture Notes in Computer Science, Vol. 12459. Cham: Springer. pp. 124-140
Nguyen, Vu-Linh; Destercke, Sébastien and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2019):
Epistemic Uncertainty Sampling.
In: Kralj Novak, Petra; Šmuc, Tomislav and Džeroski, Sašo (eds.) :
Discovery Science. 22nd International Conference, DS 2019, Split, Croatia, October 28–30, 2019, Proceedings. Lecture Notes in Computer Science, Vol. 11828. pp. 72-86
ORCID: https://orcid.org/0000-0002-9944-4108
(2019):
Epistemic Uncertainty Sampling.
In: Kralj Novak, Petra; Šmuc, Tomislav and Džeroski, Sašo (eds.) :
Discovery Science. 22nd International Conference, DS 2019, Split, Croatia, October 28–30, 2019, Proceedings. Lecture Notes in Computer Science, Vol. 11828. pp. 72-86
Conference or Workshop Item
Nguyen, Vu-Linh ORCID: https://orcid.org/0000-0003-1642-4468; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108; Rapp, Michael ORCID: https://orcid.org/0000-0001-8570-8240; Loza Mencia, Eneldo and Fürnkranz, Johannes
(15. October 2020):
On Aggregation in Ensembles of Multilabel Classifiers.
23rd International Conference on Discovery Science, Virtual, 19-21 October 2020.
In: Discovery Science,
Vol. 12323
Cham: Springer. pp. 533-547
ORCID: https://orcid.org/0000-0003-1642-4468; Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108; Rapp, Michael ORCID: https://orcid.org/0000-0001-8570-8240; Loza Mencia, Eneldo and Fürnkranz, Johannes
(15. October 2020):
On Aggregation in Ensembles of Multilabel Classifiers.
23rd International Conference on Discovery Science, Virtual, 19-21 October 2020.
In: Discovery Science,
Vol. 12323
Cham: Springer. pp. 533-547
Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108; Fürnkranz, Johannes; Loza Mencia, Eneldo; Nguyen, Vu-Linh ORCID: https://orcid.org/0000-0003-1642-4468 and Rapp, Michael ORCID: https://orcid.org/0000-0001-8570-8240
(August 2020):
Rule-Based Multi-label Classification: Challenges and Opportunities.
4th International Joint Conference on Rules and Reasoning, Virtual, 29 June - 1 July 2020.
In: Rules and Reasoning,
Vol. 12173
Cham: Springer. pp. 3-19
ORCID: https://orcid.org/0000-0002-9944-4108; Fürnkranz, Johannes; Loza Mencia, Eneldo; Nguyen, Vu-Linh ORCID: https://orcid.org/0000-0003-1642-4468 and Rapp, Michael ORCID: https://orcid.org/0000-0001-8570-8240
(August 2020):
Rule-Based Multi-label Classification: Challenges and Opportunities.
4th International Joint Conference on Rules and Reasoning, Virtual, 29 June - 1 July 2020.
In: Rules and Reasoning,
Vol. 12173
Cham: Springer. pp. 3-19
Nguyen, Vu-Linh ORCID: https://orcid.org/0000-0003-1642-4468 and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(February 2020):
Reliable Multilabel Classification: Prediction with Partial Abstention.
34th AAAI Conference on Artificial Intelligence, New York, USA, 7-12 Feburary 2020.
Proceedings of the AAAI Conference on Artificial Intelligence.
Vol. 34, No. 04
pp. 5264-5271
ORCID: https://orcid.org/0000-0003-1642-4468 and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(February 2020):
Reliable Multilabel Classification: Prediction with Partial Abstention.
34th AAAI Conference on Artificial Intelligence, New York, USA, 7-12 Feburary 2020.
Proceedings of the AAAI Conference on Artificial Intelligence.
Vol. 34, No. 04
pp. 5264-5271
Nguyen, Vu-Linh; Destercke, Sébastien; Masson, Marie-Hélène and Hüllermeier, Eyke ORCID: https://orcid.org/0000-0002-9944-4108
(2018):
Reliable Multi-class Classification based on Pairwise Epistemic and Aleatoric Uncertainty.
Twenty-Seventh International Joint Conference on Artificial Intelligence, Stockholm, Sweden, 13-19 July 2018.
Lang, Jérôme (ed.) :
In: Proceedings of the Twenty-Seventh International Joint Conference on Artificial Intelligence,
Menlo Park, County of San Mateo, California: pp. 5089-5095
ORCID: https://orcid.org/0000-0002-9944-4108
(2018):
Reliable Multi-class Classification based on Pairwise Epistemic and Aleatoric Uncertainty.
Twenty-Seventh International Joint Conference on Artificial Intelligence, Stockholm, Sweden, 13-19 July 2018.
Lang, Jérôme (ed.) :
In: Proceedings of the Twenty-Seventh International Joint Conference on Artificial Intelligence,
Menlo Park, County of San Mateo, California: pp. 5089-5095