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Publications by Pflaum, Jens

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2018

Geiger, Michael; Schwarz, Lukas; Zschieschang, Ute; Manske, Dirk; Pflaum, Jens; Weis, Jürgen; Klauk, Hagen; Weitz, Ralf Thomas (2018): Quantitative Analysis of the Density of Trap States in Semiconductors by Electrical Transport Measurements on Low-Voltage Field-Effect Transistors. In: Physical Review Applied, Vol. 10, No. 4, 44023

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