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Eine Ebene höherGruppiert nach: Dokumententyp |
Veröffentlichungsdatum
Anzahl der Publikationen: 3
2020
Hoecker, Julian; Ozcan, Mehmet; Hammer, Sebastian; Fischer, Mathias; Bichler, Benedikt; Armer, Melina; Rieder, Philipp; Drach, Volker; Pflaum, Jens; Nickel, Bert und Dyakonov, Vladimir
(2020):
Seed crystal free growth of high-quality double cation - double halide perovskite single crystals for optoelectronic applications.
In: Journal of Materials Chemistry C, Bd. 8, Nr. 24: S. 8275-8283
Geiger, Michael; Acharya, Rachana; Reutter, Eric; Ferschke, Thomas; Zschieschang, Ute; Weis, Jürgen; Pflaum, Jens; Klauk, Hagen und Weitz, Ralf Thomas
(2020):
Effect of the Degree of the Gate-Dielectric Surface Roughness on the Performance of Bottom-Gate Organic Thin-Film Transistors.
In: Advanced Materials Interfaces, Bd. 7, Nr. 10, 1902145
2018
Geiger, Michael; Schwarz, Lukas; Zschieschang, Ute; Manske, Dirk; Pflaum, Jens; Weis, Jürgen; Klauk, Hagen und Weitz, Ralf Thomas
(2018):
Quantitative Analysis of the Density of Trap States in Semiconductors by Electrical Transport Measurements on Low-Voltage Field-Effect Transistors.
In: Physical Review Applied, Bd. 10, Nr. 4, 44023