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Anzahl der Publikationen: 5
Zeitschriftenartikel
Rührmair, Ulrich
(2022):
Secret-free security: a survey and tutorial.
In: Journal of Cryptographic Engineering, Bd. 12, Nr. 4: S. 387-412
[PDF, 1MB]
Jin, Chenglu; Burleson, Wayne; Dijk, Marten van und Rührmair, Ulrich
(2022):
Programmable access-controlled and generic erasable PUF design and its applications.
In: Journal of Cryptographic Engineering, Bd. 12, Nr. 4: S. 413-432
Chang, Chip-Hong; Holcomb, Daniel E.; Rührmair, Ulrich und Schaumont, Patrick
(2021):
The ASHES 2019 special issue at JCEN.
In: Journal of Cryptographic Engineering, Bd. 11, Nr. 3: S. 199-200
[PDF, 150kB]
Konferenzbeitrag
Pavanello, Fabio; Marchand, Cedric; O’Connor, Ian; Orobtchouk, Régis; Mandorlo, Fabien; Letartre, Xavier; Cueff, Sebastien; Vatajelu, Elena Ioana; Di Natale, Giorgio; Cluzel, Benot; Coillet, Aurelien; Charbonnier, Benoit; Noé, Pierre; Kavan, Frantisek; Zoldak, Martin; Szaj, Michal; Bienstman, Peter; Vaerenbergh, Thomas Van; Rührmair, Ulrich; Flores, Paulo; Guerra e Silva, Luis; Chaves, Ricardo; Silveira, Luis-Miguel; Ceccato, Mariano; Gizopoulos, Dimitris; Papadimitriou, George; Karakostas, Vasileios; Brando, Axel; Cazorla, Francisco J.; Canal, Ramon; Closas, Pau; Gusi-Amigó, Adriá; Crovetti, Paolo; Carpegna, Alessio; Carmona, Tzamn Melendez; Di Carlo, Stefano und Savino, Alessandro
(2023):
NEUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS.
28th IEEE European Test Symposium (ETS), Venice, Italy, 22. - 26. Mai 2023.
Institute of Electrical and Electronics Engineers (Hrsg.),
In: 2023 IEEE European Test Symposium (ETS),
Piscataway: IEEE.
Kappelhoff, Fynn; Rasche, Rasmus; Mukhopadhyay, Debdeep und Rührmair, Ulrich
(2022):
Strong PUF Security Metrics: Response Sensitivity to Small Challenge Perturbations.
23rd International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, USA, 06-07 April 2022.
In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Piscataway, NJ, USA: IEEE. S. 1-10