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Anzahl der Publikationen: 6
Zeitschriftenartikel
Milbich, Timo 
ORCID: https://orcid.org/0000-0002-5012-0874; Roth, Karsten; Brattoli, Biagio ORCID: https://orcid.org/0000-0002-8482-3375 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2022):
Sharing Matters for Generalization in Deep Metric Learning.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 1: S. 416-427
ORCID: https://orcid.org/0000-0002-5012-0874; Roth, Karsten; Brattoli, Biagio ORCID: https://orcid.org/0000-0002-8482-3375 und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2022):
Sharing Matters for Generalization in Deep Metric Learning.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 1: S. 416-427
Bilic, Patrick; Christ, Patrick; Li, Hongwei Bran; Vorontsov, Eugene; Ben-Cohen, Avi; Kaissis, Georgios; Szeskin, Adi; Jacobs, Colin; Mamani, Gabriel Efrain Humpire; Chartrand, Gabriel; Lohoefer, Fabian; Holch, Julian Walter; Sommer, Wieland; Hofmann, Felix; Hostettler, Alexandre; Lev-Cohain, Naama; Drozdzal, Michal; Amitai, Michal Marianne; Vivanti, Refael; Sosna, Jacob; Ezhov, Ivan; Sekuboyina, Anjany; Navarro, Fernando; Kofler, Florian; Paetzold, Johannes C.; Shit, Suprosanna; Hu, Xiaobin; Lipkova, Jana; Rempfler, Markus; Piraud, Marie; Kirschke, Jan; Wiestler, Benedikt; Zhang, Zhiheng; Huelsemeyer, Christian; Beetz, Marcel; Ettlinger, Florian; Antonelli, Michela; Bae, Woong; Bellver, Miriam; Bi, Lei; Chen, Hao; Chlebus, Grzegorz; Dam, Erik B.; Dou, Qi; Fu, Chi-Wing; Georgescu, Bogdan; Giro-I-Nieto, Xavier; Gruen, Felix; Han, Xu; Heng, Pheng-Ann; Hesser, Jürgen; Moltz, Jan Hendrik; Igel, Christian; Isensee, Fabian; Jaeger, Paul; Jia, Fucang; Kaluva, Krishna Chaitanya; Khened, Mahendra; Kim, Ildoo; Kim, Jae-Hun; Kim, Sungwoong; Kohl, Simon; Konopczynski, Tomasz; Kori, Avinash; Krishnamurthi, Ganapathy; Li, Fan; Li, Hongchao; Li, Junbo; Li, Xiaomeng; Lowengrub, John; Ma, Jun; Maier-Hein, Klaus; Maninis, Kevis-Kokitsi; Meine, Hans; Merhof, Dorit; Pai, Akshay; Perslev, Mathias; Petersen, Jens; Pont-Tuset, Jordi; Qi, Jin; Qi, Xiaojuan; Rippel, Oliver; Roth, Karsten; Sarasua, Ignacio; Schenk, Andrea; Shen, Zengming; Torres, Jordi; Wachinger, Christian; Wang, Chunliang; Weninger, Leon; Wu, Jianrong; Xu, Daguang; Yang, Xiaoping; Yu, Simon Chun-Ho; Yuan, Yading; Yue, Miao; Zhang, Liping; Cardoso, Jorge; Bakas, Spyridon; Braren, Rickmer; Heinemann, Volker; Pal, Christopher; Tang, An; Kadoury, Samuel; Soler, Luc; Ginneken, Bram van; Greenspan, Hayit; Joskowicz, Leo und Menze, Bjoern
(2022):
The Liver Tumor Segmentation Benchmark (LiTS).
In: Medical Image Analysis, Bd. 84, 102680
Konferenzbeitrag
Milbich, Timo; Roth, Karsten; Sinha, Samarth; Schmidt, Ludwig; Ghassemi, Marzyeh und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Characterizing Generalization under Out-Of-Distribution Shifts in Deep Metric Learning.
35th Conference on Neural Information Processing Systems (NeurIPS 2022), Online, 6-14 December 2021.
Neural Information Processing Systems Foundation (Hrsg.),
In: 35th Neural Information Processing Systems Foundation,
Red Hook, NY: Curran Associates.
ORCID: https://orcid.org/0000-0003-0766-120X
(2021):
Characterizing Generalization under Out-Of-Distribution Shifts in Deep Metric Learning.
35th Conference on Neural Information Processing Systems (NeurIPS 2022), Online, 6-14 December 2021.
Neural Information Processing Systems Foundation (Hrsg.),
In: 35th Neural Information Processing Systems Foundation,
Red Hook, NY: Curran Associates.
Roth, Karsten; Milbich, Timo; Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X; Cohen, Joseph Paul und Ghassemi, Marzyeh
(17. September 2020):
S2SD: Simultaneous Similarity-based Self-Distillation for Deep Metric Learning.
38th International Conference on Machine Learning, Online, 18-24 July 2021.
ORCID: https://orcid.org/0000-0003-0766-120X; Cohen, Joseph Paul und Ghassemi, Marzyeh
(17. September 2020):
S2SD: Simultaneous Similarity-based Self-Distillation for Deep Metric Learning.
38th International Conference on Machine Learning, Online, 18-24 July 2021.
Roth, Karsten; Milbich, Timo und Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X
(2020):
PADS: Policy-Adapted Sampling for Visual Similarity Learning.
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Seattle, WA, USA, 13-19 June 2020.
In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 6567-6576
ORCID: https://orcid.org/0000-0003-0766-120X
(2020):
PADS: Policy-Adapted Sampling for Visual Similarity Learning.
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Seattle, WA, USA, 13-19 June 2020.
In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. S. 6567-6576
Milbich, Timo; Roth, Karsten; Bharadhwaj, Homanga; Sinha, Samarth; Bengio, Yoshua; Ommer, Björn ORCID: https://orcid.org/0000-0003-0766-120X und Cohen, Joseph Paul
(2020):
DiVA: Diverse Visual Feature Aggregation for Deep Metric Learning.
16th European Conference on Computer Vision (ECCV), Glasgow, 23-28 August, 2020.
Vedaldi, Andrea; Bischof, Horst; Brox, Thomas und Frahm, Jan-Michael (Hrsg.):
In: Computer Vision – ECCV 2020,
Bd. 8
Cham: Springer International Publishing. S. 590-607
ORCID: https://orcid.org/0000-0003-0766-120X und Cohen, Joseph Paul
(2020):
DiVA: Diverse Visual Feature Aggregation for Deep Metric Learning.
16th European Conference on Computer Vision (ECCV), Glasgow, 23-28 August, 2020.
Vedaldi, Andrea; Bischof, Horst; Brox, Thomas und Frahm, Jan-Michael (Hrsg.):
In: Computer Vision – ECCV 2020,
Bd. 8
Cham: Springer International Publishing. S. 590-607