Anzahl der Publikationen: 8
Zeitschriftenartikel
Ali, Mehdi; Berrendorf, Max; Hoyt, Charles Tapley; Vermue, Laurent; Galkin, Mikhail; Sharifzadeh, Sahand; Fischer, Asja; Tresp, Volker und Lehmann, Jens
(2022):
Bringing Light Into the Dark: A Large-Scale Evaluation of Knowledge Graph Embedding Models Under a Unified Framework.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Bd. 44, Nr. 12: S. 8825-8845
Carrami, Eli M.; Sharifzadeh, Sahand; Wietek, Nina C.; Artibani, Mara; El-Sahhar, Salma; Sauka-Spengler, Tatjana; Yau, Christopher; Tresp, Volker und Ahmed, Ahmed A.
(2020):
A highly accurate platform for clone-specific mutation discovery enables the study of active mutational processes.
In: eLife, Bd. 9, e55207
[PDF, 1MB]
Konferenzbeitrag
Li, Hang; Gu, Jindong; Koner, Rajat; Sharifzadeh, Sahand und Tresp, Volker
ORCID: https://orcid.org/0000-0001-9428-3686
(2023):
Do DALL-E and Flamingo Understand Each Other?
IEEE/CVF International Conference on Computer Vision (ICCV), Paris, France, 02.-06. Oktober 2023.
Jurie, Frédéric und Sharma, Gaurav (Hrsg.):
In: 2023 IEEE/CVF International Conference on Computer Vision (ICCV),
Piscataway, NJ: IEEE. S. 1999-2010
Shit, Suprosanna
ORCID: https://orcid.org/0000-0003-4435-7207; Koner, Rajat
ORCID: https://orcid.org/0000-0003-3441-8192; Wittmann, Bastian; Paetzold, Johannes; Ezhov, Ivan; Li, Hongwei; Pan, Jiazhen; Sharifzadeh, Sahand; Kaissis, Georgios; Tresp, Volker und Menze, Bjoern
(2022):
Relationformer: A Unified Framework for Image-to-Graph Generation.
17th European Conference on Computer Vision (ECCV 2022), Tel Aviv, Israel, October 23–27, 2022.
Avidan, Shai; Brostow, Gabriel; Cissé, Moustapha; Farinella, Giovanni Maria und Hassner, Tal (Hrsg.):
In: Computer Vision – ECCV 2022, Lecture Notes in Computer Science
Bd. 13697
Cham, Switzerland: Springer. S. 422-439
Sharifzadeh, Sahand; Baharlou, Sina Moayed; Berrendorf, Max; Koner, Rajat und Tresp, Volker
(2021):
Improving Visual Relation Detection using Depth Maps.
2020 25th International Conference on Pattern Recognition (ICPR), Milan, Italy, 10-15 January 2021.
In: 2020 25th International Conference on Pattern Recognition (ICPR),
New York: IEEE. S. 3597-3604
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