Anzahl der Publikationen: 11
Hochschulschrift
Zeitschriftenartikel
Bischl, Bernd ORCID: https://orcid.org/0000-0001-6002-6980; Binder, Martin; Lang, Michel ORCID: https://orcid.org/0000-0001-9754-0393; Pielok, Tobias; Richter, Jakob ORCID: https://orcid.org/0000-0003-4481-5554; Coors, Stefan ORCID: https://orcid.org/0000-0002-7465-2146; Thomas, Janek; Ullmann, Theresa ORCID: https://orcid.org/0000-0003-1215-8561; Becker, Marc ORCID: https://orcid.org/0000-0002-8115-0400; Boulesteix, Anne‐Laure ORCID: https://orcid.org/0000-0002-2729-0947; Deng, Difan und Lindauer, Marius ORCID: https://orcid.org/0000-0002-9675-3175
(2023):
Hyperparameter optimization: Foundations, algorithms, best practices, and open challenges.
In: WIREs Data Mining and Knowledge Discovery, Bd. 13, Nr. 2
[PDF, 6MB]
Schiffner, Julia; Bischl, Bernd; Lang, Michel; Richter, Jakob; Jones, Zachary M.; Probst, Philipp; Pfisterer, Florian; Gallo, Mason; Kirchhoff, Dominik; Kühn, Tobias; Thomas, Janek und Kotthoff, Lars
(2016):
mlr Tutorial.
In: CoRR, Bd. abs/1609.06146
Konferenzbeitrag
Schneider, Lennart ORCID: https://orcid.org/0000-0003-4152-5308; Bischl, Bernd ORCID: https://orcid.org/0000-0001-6002-6980 und Thomas, Janek ORCID: https://orcid.org/0000-0003-4511-6245
(2023):
Multi-Objective Optimization of Performance and Interpretability of Tabular Supervised Machine Learning Models.
GECCO '23: Genetic and Evolutionary Computation Conference, Lisbon Portugal, July 15 - 19, 2023.
Silva, Sara und Paquete, Luís (Hrsg.):
In: GECCO '23: Proceedings of the Genetic and Evolutionary Computation Conference,
New York, NY, United States: Association for Computing Machinery. S. 538-547
[PDF, 781kB]
Goschenhofer, Jann; Hvingelby, Rasmus; Rügamer, David ORCID: https://orcid.org/0000-0002-8772-9202; Thomas, Janek; Wagner, Moritz und Bischl, Bernd
(2021):
Deep Semi-supervised Learning for Time Series Classification.
2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA), Pasadena, CA, USA, 13-16 December 2021.
In: 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA),
New York: IEEE. S. 422-428
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