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Gruppiert nach: Dokumententyp | Veröffentlichungsdatum
Anzahl der Publikationen: 7

Zeitschriftenartikel

Frey, Laura; Pöhls, Jonas Fredrik; Hennemann, Matthias; Mähringer, Andre; Reuter, Stephan; Clark, Timothy; Weitz, Ralf Thomas und Medina, Dana Dina (2022): Oriented Thiophene-Extended Benzotrithiophene Covalent Organic Framework Thin Films: Directional Electrical Conductivity. In: Advanced Functional Materials, Bd. 32, Nr. 47 [PDF, 3MB]

Lenz, Jakob; Seiler, Anna Monika; Geisenhof, Fabian Rudolf; Winterer, Felix; Watanabe, Kenji; Taniguchi, Takashi und Weitz, Ralf Thomas (2021): High-Performance Vertical Organic Transistors of Sub-5 nm Channel Length. In: Nano Letters, Bd. 21, Nr. 10: S. 4430-4436

Wang, Zhiyong; Walter, Lisa S.; Wang, Mao; St Petkov, Petko; Liang, Baokun; Qi, Haoyuan; Nguyen, Ngan Nguyen; Hambsch, Mike; Zhong, Haixia; Wang, Mingchao; Park, SangWook; Renn, Lukas; Watanabe, Kenji; Taniguchi, Takashi; Mannsfeld, Stefan C. B.; Heine, Thomas; Kaiser, Ute; Zhou, Shengqiang; Weitz, Ralf Thomas; Feng, Xinliang und Dong, Renhao (2021): Interfacial Synthesis of Layer-Oriented 2D Conjugated Metal-Organic Framework Films toward Directional Charge Transport. In: Journal of the American Chemical Society, Bd. 143, Nr. 34: S. 13624-13632

Winterer, Felix; Walter, Lisa Sophie; Lenz, Jakob; Seebauer, Stefan; Tong, Yu; Polavarapu, Lakshminarayana und Weitz, Ralf Thomas (2021): Charge Traps in All-Inorganic CsPbBr3 Perovskite Nanowire Field-Effect Phototransistors. In: Advanced Electronic Materials, Bd. 7, Nr. 6, 2100105

Geiger, Michael; Acharya, Rachana; Reutter, Eric; Ferschke, Thomas; Zschieschang, Ute; Weis, Jürgen; Pflaum, Jens; Klauk, Hagen und Weitz, Ralf Thomas (2020): Effect of the Degree of the Gate-Dielectric Surface Roughness on the Performance of Bottom-Gate Organic Thin-Film Transistors. In: Advanced Materials Interfaces, Bd. 7, Nr. 10, 1902145

Vladimirov, Ilja; Müller, Sebastian; Baumann, Roelf-Peter; Gesser, Thomas; Molla, Zahra; Grigorian, Souren; Köhler, Anna; Baessler, Heinz; Pietsch, Ullrich und Weitz, Ralf Thomas (2019): Dielectric-Semiconductor Interface Limits Charge Carrier Motion at Elevated Temperatures and Large Carrier Densities in a High-Mobility Organic Semiconductor. In: Advanced Functional Materials, Bd. 29, Nr. 12, 1807867

Geiger, Michael; Schwarz, Lukas; Zschieschang, Ute; Manske, Dirk; Pflaum, Jens; Weis, Jürgen; Klauk, Hagen und Weitz, Ralf Thomas (2018): Quantitative Analysis of the Density of Trap States in Semiconductors by Electrical Transport Measurements on Low-Voltage Field-Effect Transistors. In: Physical Review Applied, Bd. 10, Nr. 4, 44023

Diese Liste wurde am Sat Dec 21 21:23:39 2024 CET erstellt.