Anzahl der Publikationen: 7
Zeitschriftenartikel
Frey, Laura; Pöhls, Jonas Fredrik; Hennemann, Matthias; Mähringer, Andre; Reuter, Stephan; Clark, Timothy; Weitz, Ralf Thomas und Medina, Dana Dina
(2022):
Oriented Thiophene-Extended Benzotrithiophene Covalent Organic Framework Thin Films: Directional Electrical Conductivity.
In: Advanced Functional Materials, Bd. 32, Nr. 47
[PDF, 3MB]
Wang, Zhiyong; Walter, Lisa S.; Wang, Mao; St Petkov, Petko; Liang, Baokun; Qi, Haoyuan; Nguyen, Ngan Nguyen; Hambsch, Mike; Zhong, Haixia; Wang, Mingchao; Park, SangWook; Renn, Lukas; Watanabe, Kenji; Taniguchi, Takashi; Mannsfeld, Stefan C. B.; Heine, Thomas; Kaiser, Ute; Zhou, Shengqiang; Weitz, Ralf Thomas; Feng, Xinliang und Dong, Renhao
(2021):
Interfacial Synthesis of Layer-Oriented 2D Conjugated Metal-Organic Framework Films toward Directional Charge Transport.
In: Journal of the American Chemical Society, Bd. 143, Nr. 34: S. 13624-13632
Winterer, Felix; Walter, Lisa Sophie; Lenz, Jakob; Seebauer, Stefan; Tong, Yu; Polavarapu, Lakshminarayana und Weitz, Ralf Thomas
(2021):
Charge Traps in All-Inorganic CsPbBr3 Perovskite Nanowire Field-Effect Phototransistors.
In: Advanced Electronic Materials, Bd. 7, Nr. 6, 2100105
Geiger, Michael; Acharya, Rachana; Reutter, Eric; Ferschke, Thomas; Zschieschang, Ute; Weis, Jürgen; Pflaum, Jens; Klauk, Hagen und Weitz, Ralf Thomas
(2020):
Effect of the Degree of the Gate-Dielectric Surface Roughness on the Performance of Bottom-Gate Organic Thin-Film Transistors.
In: Advanced Materials Interfaces, Bd. 7, Nr. 10, 1902145
Vladimirov, Ilja; Müller, Sebastian; Baumann, Roelf-Peter; Gesser, Thomas; Molla, Zahra; Grigorian, Souren; Köhler, Anna; Baessler, Heinz; Pietsch, Ullrich und Weitz, Ralf Thomas
(2019):
Dielectric-Semiconductor Interface Limits Charge Carrier Motion at Elevated Temperatures and Large Carrier Densities in a High-Mobility Organic Semiconductor.
In: Advanced Functional Materials, Bd. 29, Nr. 12, 1807867
Geiger, Michael; Schwarz, Lukas; Zschieschang, Ute; Manske, Dirk; Pflaum, Jens; Weis, Jürgen; Klauk, Hagen und Weitz, Ralf Thomas
(2018):
Quantitative Analysis of the Density of Trap States in Semiconductors by Electrical Transport Measurements on Low-Voltage Field-Effect Transistors.
In: Physical Review Applied, Bd. 10, Nr. 4, 44023
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