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Sanakoyeu, Artsiom; Tschernezki, Vadim; Büchler, Uta ORCID logoORCID: https://orcid.org/0000-0002-0074-8559 and Ommer, Björn ORCID logoORCID: https://orcid.org/0000-0003-0766-120X (2019): Divide and Conquer the Embedding Space for Metric Learning. 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15-20 June 2019. In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), New York: IEEE. pp. 471-480

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