Ufer, Nikolai and Ommer, Björn
ORCID: https://orcid.org/0000-0003-0766-120X
(2017):
Deep Semantic Feature Matching.
2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, 21-26 July 2017.
In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR),
New York: IEEE. pp. 5929-5938
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Faculties: | History and Art History > Department of Art History > Art History |
| Subjects: | 000 Computer science, information and general works > 004 Data processing computer science 700 Arts and recreation > 700 Arts |
| Place of Publication: | New York |
| Language: | English |
| Item ID: | 107304 |
| Date Deposited: | 04. Oct 2023, 13:47 |
| Last Modified: | 04. Oct 2023, 13:47 |
Actions (login required)
- View Item
