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Rubio, Jose und Ommer, Björn ORCID logoORCID: https://orcid.org/0000-0003-0766-120X (2015): Regularizing max-margin exemplars by reconstruction and generative models. 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Boston, MA, USA, 07-12 June 2015. In: 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), New York: IEEE. S. 4213-4221

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